This paper presents a novel technique for dark current compensation of a CMOS image
sensor (CIS) by using in-pixel temperature sensors (IPTSs) over a temperature range from …

We present data for the dark current of a commercially available CMOS image sensor for
different gain settings and bias offsets over the temperature range of 295 to 340 K and …

In this paper, we present a systematic study on the rate of dark current generation of two
scientific charge-coupled device imagers. The dark current in both imagers was measured …

In this paper a novel technique to compensate for dark current of a CMOS image sensor
(CIS) by using in-pixel temperature sensors (IPTSs) is presented. The IPTSs are integrated …

The potential well in back-illuminated charge-coupled devices (CCDs) does not reach all the
way to the back surface. Hence, light that is absorbed in the field-free region generates …

We present an analysis of dark current from a complementary metal–oxide–semiconductor
(CMOS) active pixels sensor with global shutter. The presence of two sources of dark …

Digital single-lens reflex (DSLR) cameras are examined and their dark current behavior is
presented. We examine the influence of varying temperature, exposure time, and gain …

Thermal excitation of electrons is a major source of noise in Charge-Coupled Device (CCD)
imagers. Those electrons are generated even in the absence of light, hence the name dark …

Context. Astrophysical observations must be corrected for their imperfections of instrumental
origin. When charge-coupled devices (CCDs) are used, their dark signal is one such …

Thermal excitation of electrons is a major source of noise in charge-coupled-device (CCD)
imagers. Those electrons are generated even in the absence of light, hence, the name dark …