A literature review on planning and analysis of accelerated testing for reliability assessment
Accelerated testing has been widely used for several decades. Started with accelerated life
tests with constant‐stress loadings, more interest has been focused prominently on …
tests with constant‐stress loadings, more interest has been focused prominently on …
Advances in Bayesian decision making in reliability
Starting in the late 80s Bayesian methods have gained increasing attention in the reliability
literature. The focus of most of the earlier Bayesian work in reliability involved statistical …
literature. The focus of most of the earlier Bayesian work in reliability involved statistical …
A high-efficiency aging test with new data processing method for semiconductor device
X Yang, Q Sang, J Zhang, C Wang, M Yu… - Microelectronics …, 2023 - Elsevier
The aging test of semiconductor devices plays a crucial role in modeling the degradation
mechanisms. Conventionally, the voltage stress used to accelerate aging is determined by …
mechanisms. Conventionally, the voltage stress used to accelerate aging is determined by …
Bayesian methods for planning accelerated life tests
Y Zhang, WQ Meeker - Technometrics, 2006 - Taylor & Francis
This article describes Bayesian methods for accelerated life test planning with one
accelerating variable, when the acceleration model is linear in the parameters, based on …
accelerating variable, when the acceleration model is linear in the parameters, based on …
A bibliography of accelerated test plans part II-references
WB Nelson - IEEE transactions on Reliability, 2005 - ieeexplore.ieee.org
A bibliography of accelerated test plans part II - references Page 1 370 IEEE TRANSACTIONS
ON RELIABILITY, VOL. 54, NO. 3, SEPTEMBER 2005 A Bibliography of Accelerated Test Plans …
ON RELIABILITY, VOL. 54, NO. 3, SEPTEMBER 2005 A Bibliography of Accelerated Test Plans …
Design of accelerated life test plans—overview and prospect
WH Chen, L Gao, J Pan, P Qian, QC He - Chinese Journal of Mechanical …, 2018 - Springer
Accelerated life test (ALT) is currently the main method of assessing product reliability
rapidly, and the design of efficient test plans is a critical step to ensure that ALTs can assess …
rapidly, and the design of efficient test plans is a critical step to ensure that ALTs can assess …
A general Bayes exponential inference model for accelerated life testing
JR Van Dorp, TA Mazzuchi - Journal of statistical planning and inference, 2004 - Elsevier
This article develops a general Bayes inference model for accelerated life testing assuming
failure times at each stress level are exponentially distributed. Using the approach, Bayes …
failure times at each stress level are exponentially distributed. Using the approach, Bayes …
Efficient Monte Carlo estimation of the expected value of sample information using moment matching
Background. The Expected Value of Sample Information (EVSI) is used to calculate the
economic value of a new research strategy. Although this value would be important to both …
economic value of a new research strategy. Although this value would be important to both …
[HTML][HTML] Bayesian accelerated life test plans for series systems with Weibull component lifetimes
S Roy - Applied Mathematical Modelling, 2018 - Elsevier
This article presents optimal Bayesian accelerated life test plans for series systems under
Type-I censoring scheme. First, the component lifetimes are assumed to follow independent …
Type-I censoring scheme. First, the component lifetimes are assumed to follow independent …
Planning simple step-stress accelerated life tests using Bayesian methods
T Yuan, X Liu, W Kuo - IEEE Transactions on Reliability, 2011 - ieeexplore.ieee.org
This study proposes Bayesian methods for planning optimal simple step-stress accelerated
life tests. The Bayesian approach is an attractive alternative to the maximum likelihood …
life tests. The Bayesian approach is an attractive alternative to the maximum likelihood …