Functionally Possible Path Delay Faults With High Functional Switching Activity
I Pomeranz, Y Zorian - IEEE Transactions on Very Large Scale …, 2024 - ieeexplore.ieee.org
Chip aging that results in small delay defects is one of the possible causes for silent data
corruption that has been observed in large datacenters. Chip aging is exacerbated by high …
corruption that has been observed in large datacenters. Chip aging is exacerbated by high …
Yield Maximization of Flip-Flop Circuits Based on Deep Neural Network and Polyhedral Estimation of Nonlinear Constraints
In this paper, we propose a method based on deep neural networks for the statistical design
of flip-flops, taking into account nonlinear performance constraints. Flip-flop design and …
of flip-flops, taking into account nonlinear performance constraints. Flip-flop design and …
Reliability and Optimization Simulation Study of Zero-Temperature-Delay Point in Digital Circuits for Advanced Technology
M Zheng, W Chen, Y Lyu, L Cai - IEEE Transactions on Device …, 2023 - ieeexplore.ieee.org
Thermal challenges are increasingly significant for advanced technology, and the operating
environment with large temperature variation also acts as one of the crucial threats to the …
environment with large temperature variation also acts as one of the crucial threats to the …
In-Field Testing of Functionally-Possible Transition Faults With High Activation Frequencies
I Pomeranz, Y Zorian - IEEE Transactions on Device and …, 2024 - ieeexplore.ieee.org
Motivated by the reliability requirements of chips in state-of-the-art technologies, this article
develops an approach to periodic in-field testing that has the following features. The faults …
develops an approach to periodic in-field testing that has the following features. The faults …
A Method Adopting Aging Corner to Improve the Accuracy of Device Aging Simulation Model
Q Sang, X Yang, J Zhang, C Wang… - IEEE Transactions on …, 2023 - ieeexplore.ieee.org
In order to predict the circuit liftetime accurately in the design phase, precise device aging
models are enssential. Although some aging simulation models have been established in …
models are enssential. Although some aging simulation models have been established in …
Exploring the NBTI Aging and PVT effects on RRAM-based FPGA Multiplexers Performance
Among the emerging technologies, Resistive RAM (RRAM) devices are considered a
promising candidate for the replacement of Static RAM (SRAM) cells as memory elements in …
promising candidate for the replacement of Static RAM (SRAM) cells as memory elements in …