Understanding ic3

AR Bradley - International Conference on Theory and Applications of …, 2012 - Springer
The recently introduced model checking algorithm, IC3, has proved to be among the best
SAT-based safety model checkers. Many implementations now exist. This paper provides …

Constraint extraction for pseudo-functional scan-based delay testing

YC Lin, F Lu, K Yang, KT Cheng - Proceedings of the 2005 Asia and …, 2005 - dl.acm.org
Recent research results have shown that the traditional structural testing for delay and
crosstalk faults may result in over-testing due to the non-trivial number of such faults that are …

A circuit-based SAT solver for logic synthesis

HT Zhang, JHR Jiang… - 2021 IEEE/ACM …, 2021 - ieeexplore.ieee.org
In recent years SAT solving has been widely used to implement various circuit
transformations in logic synthesis. However, off-the-shelf CNF-based SAT solvers often have …

Simulation-based bug trace minimization with BMC-based refinement

K Chang, V Bertacco, IL Markov - IEEE Transactions on …, 2006 - ieeexplore.ieee.org
Finding the cause of a bug can be one of the most time-consuming activities in design
verification. This is particularly true in the case of bugs discovered in the context of a random …

An efficient circuit-based SAT solver and its application in logic equivalence checking

K Hu, Z Chu - Microelectronics Journal, 2023 - Elsevier
In this paper, we propose an integrated approach that combines a circuit-based SAT solver
(CirSAT) with a technique based on XOR-Majority Graph (XMG) rewriting for logic …

A performance-driven QBF-based iterative logic array representation with applications to verification, debug and test

H Mangassarian, A Veneris, S Safarpour… - 2007 IEEE/ACM …, 2007 - ieeexplore.ieee.org
Many CAD for VLSI techniques use time-frame expansion, also known as the Iterative Logic
Array representation, to model the sequential behavior of a system. Replicating industrial …

Pseudofunctional testing

YC Lin, F Lu, KT Cheng - IEEE Transactions on Computer …, 2006 - ieeexplore.ieee.org
Recent research results have shown that the traditional structural testing for delay and signal
integrity faults may result in overtesting due to the nontrivial number of such faults that are …

Multiple-fault diagnosis based on adaptive diagnostic test pattern generation

YC Lin, F Lu, KT Cheng - IEEE Transactions on Computer …, 2007 - ieeexplore.ieee.org
In this paper, we propose two fault-diagnosis methods for improving multiple-fault diagnosis
resolution. The first method, based on the principle of single-fault activation and single …

Deep integration of circuit simulator and SAT solver

HT Zhang, JHR Jiang, L Amarú… - 2021 58th ACM/IEEE …, 2021 - ieeexplore.ieee.org
The paper addresses a key aspect of efficient computation in logic synthesis and formal
verification, namely, the integration of a circuit simulator and a Boolean satisfiability solver. A …

RTL error diagnosis using a word-level SAT-solver

S Mirzaeian, F Zheng… - 2008 IEEE International …, 2008 - ieeexplore.ieee.org
We propose a novel methodology for design error diagnosis in the HDL description using a
word-level solver. In this approach, the patterns that result in erroneous responses are first …