Ionizing Radiation Effectsin Electronics
M Bagatin, S Gerardin - 2016 - api.taylorfrancis.com
There is an invisible enemy that constantly threatens the operation of electronics: ionizing
radiation. From sea level to outer space, ionizing radiation is virtually everywhere. At sea …
radiation. From sea level to outer space, ionizing radiation is virtually everywhere. At sea …
Dose and single-event effects on a color CMOS camera for space exploration
C Virmontois, JM Belloir, M Beaumel… - … on Nuclear Science, 2018 - ieeexplore.ieee.org
This paper focuses on the radiation-induced dose and single-event effects (SEEs) on a color
CMOS camera designed for space missions. The γ-ray and proton tests are used to evaluate …
CMOS camera designed for space missions. The γ-ray and proton tests are used to evaluate …
Radiation hardening of digital color CMOS camera-on-a-chip building blocks for multi-MGy total ionizing dose environments
V Goiffon, S Rolando, F Corbiere… - … on Nuclear Science, 2016 - ieeexplore.ieee.org
The Total Ionizing Dose (TID) hardness of digital color Camera-on-a-Chip (CoC) building
blocks is explored in the Multi-MGy range using 60 Co gamma-ray irradiations. The …
blocks is explored in the Multi-MGy range using 60 Co gamma-ray irradiations. The …
In-depth analysis on radiation induced multi-level dark current random telegraph signal in silicon solid state image sensors
C Durnez, V Goiffon, C Virmontois… - … on Nuclear Science, 2016 - ieeexplore.ieee.org
Radiation-induced phenomena constitute a big concern for image sensors dedicated to
space application. Particles (such as protons or electrons) can impact the crystalline …
space application. Particles (such as protons or electrons) can impact the crystalline …
Analysis of Angular Dependence of Single-Event Latchup Sensitivity for Heavy-Ion Irradiations of CMOS Technology
This paper presents the impact of ion angle on the single-event latuchup (SEL) cross section
with the aim of improving the interpretation of latchup cross section obtained during heavy …
with the aim of improving the interpretation of latchup cross section obtained during heavy …
Machine Learning in Space: Surveying the Robustness of on-board ML models to Radiation
Modern spacecraft are increasingly relying on machine learning (ML). However, physical
equipment in space is subject to various natural hazards, such as radiation, which may …
equipment in space is subject to various natural hazards, such as radiation, which may …
Phosphorus versus arsenic: Role of the photodiode doping element in cmos image sensor radiation-induced dark current and random telegraph signal
A Le Roch, C Virmontois, P Paillet… - … on Nuclear Science, 2020 - ieeexplore.ieee.org
This work investigates the role of the phosphorus doping element in the radiation-induced
dark current in a CMOS image sensor (CIS) photodiode. The neutron and proton irradiations …
dark current in a CMOS image sensor (CIS) photodiode. The neutron and proton irradiations …
Proton Radiation Effects of CMOS Image Sensors on Different Star Map Recognition Algorithms for Star Sensors
Y Cui, J Feng, Y Li, L Wen, Q Guo - Electronics, 2023 - mdpi.com
Star sensors are widely used by satellites for their precise pointing accuracy. However,
protons in space will cause cumulative effects and single-event transients in the imaging …
protons in space will cause cumulative effects and single-event transients in the imaging …
The use of inverse-mode SiGe HBTs as active gain stages in low-noise amplifiers for the mitigation of single-event transients
A cascode configuration with inverse-mode (IM) common-emitter silicon-germanium (SiGe)
heterojunction bipolar transistors (HBTs) is proposed for the mitigation of single-event …
heterojunction bipolar transistors (HBTs) is proposed for the mitigation of single-event …
Single event upset sensitivity of D-flip flop of infrared image sensors for low temperature applications down to 77 K
This paper presents for the first time the impact of cryogenic temperatures, down to 77 K, on
the SEU sensitivity of D-Flip-Flop (DFF) of infrared image sensor. Estimations and a failure …
the SEU sensitivity of D-Flip-Flop (DFF) of infrared image sensor. Estimations and a failure …