Low-energy ionic collisions at molecular solids

J Cyriac, T Pradeep, H Kang, R Souda… - Chemical …, 2012 - ACS Publications
The roots of mass spectrometry (MS) can be traced to the early 20th century when in the
Cavendish Laboratory at Cambridge University, UK, JJ Thomson performed his first …

Developments in molecular SIMS depth profiling and 3D imaging of biological systems using polyatomic primary ions

JS Fletcher, NP Lockyer… - Mass spectrometry …, 2011 - Wiley Online Library
In principle mass spectral imaging has enormous potential for discovery applications in
biology. The chemical specificity of mass spectrometry combined with spatial analysis …

Computational view of surface based organic mass spectrometry

BJ Garrison, Z Postawa - Mass Spectrometry Reviews, 2008 - Wiley Online Library
Surface based mass spectrometric approaches fill an important niche in the mass analysis
portfolio of tools. The particular niche depends on both the underlying physics and chemistry …

Mass spectral analysis and imaging of tissue by ToF-SIMS—The role of buckminsterfullerene, C60+, primary ions

EA Jones, NP Lockyer, JC Vickerman - International Journal of Mass …, 2007 - Elsevier
Recent developments in desorption/ionisation mass spectrometry techniques have made
their application to biological analysis a realistic and successful proposition. Developments …

A new SIMS paradigm for 2D and 3D molecular imaging of bio-systems

JS Fletcher, JC Vickerman - Analytical and bioanalytical chemistry, 2010 - Springer
With the implementation of focused primary ion beams, secondary ion mass spectrometry
(SIMS) has become a significant technique in the rapidly emerging field of mass spectral …

ToF-SIMS analysis of adsorbed proteins: principal component analysis of the primary ion species effect on the protein fragmentation patterns

S Muramoto, DJ Graham, MS Wagner… - The Journal of …, 2011 - ACS Publications
In time-of-flight secondary ion mass spectrometry (ToF-SIMS), the choice of the primary ion
used for analysis can influence the resulting mass spectrum. This is because different …

Exploring the Surface Sensitivity of TOF-Secondary Ion Mass Spectrometry by Measuring the Implantation and Sampling Depths of Bin and C60 Ions in Organic …

S Muramoto, J Brison, DG Castner - Analytical Chemistry, 2012 - ACS Publications
The surface sensitivity of Binq+ (n= 1, 3, 5, q= 1, 2) and C60q+ (q= 1, 2) primary ions in static
time-of-flight secondary ion mass spectrometry (TOF-SIMS) experiments were investigated …

SIMS—A precursor and partner to contemporary mass spectrometry

JC Vickerman, N Winograd - International Journal of Mass Spectrometry, 2015 - Elsevier
Significant events driving the development of SIMS over the last 50 years are reviewed. The
discussion includes recollections of dynamic and static SIMS from the 1970s, of the …

Surface sensitivity in cluster-ion-induced sputtering

C Szakal, J Kozole, MF Russo Jr, BJ Garrison… - Physical review …, 2006 - APS
The ion beam-induced removal of thin water ice films condensed onto Ag and bombarded
by energetic Au, Au 2, Au 3, and C 60 projectiles is examined both experimentally and with …

Sputtering Yields for C60 and Au3 Bombardment of Water Ice as a Function of Incident Kinetic Energy

MF Russo, C Szakal, J Kozole, N Winograd… - Analytical …, 2007 - ACS Publications
The total sputtering yields for water ice due to kiloelectronvolt cluster bombardment have
been measured and compared to the predictions made by the mesoscale energy deposition …