[HTML][HTML] Nanoscale characterization of graphene oxide-based epoxy nanocomposite using inverted scanning microwave microscopy
Scanning microwave microscopy (SMM) is a novel metrological tool that advances the
quantitative, nanometric, high-frequency, electrical characterization of a broad range of …
quantitative, nanometric, high-frequency, electrical characterization of a broad range of …
Quantitative characterization of platinum diselenide electrical conductivity with an inverted scanning microwave microscope
Near-field scanning microwave microscopy is a technique with increasing popularity for the
study of nanometer-scale electrical properties of samples. Here, we present an approach to …
study of nanometer-scale electrical properties of samples. Here, we present an approach to …
Electrical properties of Jurkat cells: An inverted scanning microwave microscope study
Near-field Scanning Microwave Microscopy (SMM) makes use of a high frequency signal to
image and characterize electrical properties of samples. Recently, a new SMM setup was …
image and characterize electrical properties of samples. Recently, a new SMM setup was …
Operation of near-field scanning millimeter-wave microscopy up to 67 GHz under scanning electron microscopy vision
P Polovodov, D Théron, S Eliet… - 2020 IEEE/MTT-S …, 2020 - ieeexplore.ieee.org
A near-field scanning millimeter-wave microscope is developed with broadband capabilities
up to 67 GHz. The instrumentation has been designed to operate inside a scanning electron …
up to 67 GHz. The instrumentation has been designed to operate inside a scanning electron …
Quantitative Scanning Microwave Microscopy of Few-layer Platinum Diselenide
PtSe 2 is unique among all 2D materials by having simultaneously sizable bandgap, high
carrier mobility, and air stability. Moreover, PtSe2 undergoes a semiconductor-semimetal …
carrier mobility, and air stability. Moreover, PtSe2 undergoes a semiconductor-semimetal …