Amorphization of SiO2 Thin Films by Using 200 MeV Ag15+ Ions

A Gaikwad, Y Mhaisagar, S Gupta, B Joshi, K Asokan… - Silicon, 2019 - Springer
Abstract Effect of swift heavy ions (SHI) on low-k SiO 2 thin films has been investigated. SiO
2 thin films were deposited on pre-cleaned p-Si substrate by using sol-gel spin coating …

Sol–gel deposited xerogel, aerogel and porogen based porous low- thin films: A comparative investigation

S Gupta, A Gaikwad, A Mahajan, H Lin… - International Journal of …, 2021 - World Scientific
Low dielectric constant (Low-k) films are used as inter layer dielectric (ILD) in nanoelectronic
devices to reduce interconnect delay, crosstalk noise and power consumption. Tailoring …

[PDF][PDF] GLOBAL JOURNAL OF ENGINEERING SCIENCE AND RESEARCHES

MNV Lanjulkar, NM Verulkar, CM Jadhao - gjesr.com
The introduction of various new materials and processes for fabrication of integrated circuit
(IC) revaluated a semiconductor industry during last two decades. Such revolution in …