The wireless sensor networks (WSNs) are being deployed frequently in variety of
environments such as military surveillance, forest fire monitoring, chemical leakage …

Scan test is the standard method, practiced by industry, that has consistently provided high
fault coverage due to high controllability and high observability. The scan chain allows to …

There is a need for an efficient design-for-testability to satisfy both testability and security of
digital circuits. In our previous work, we reported a secure and testable scan design …

Cryptographic algorithms are routinely used toper form computationally intense operations
over increasingly larger volumes of data, and in order to meet the high throughput …

In this paper, we introduce generalized feed-forward shift registers (GF 2 SR) to apply them
to secure and testable scan design. Previously, we introduced SR-equivalents and SR-quasi …

Echo hiding is a steganographic technique that hides messages in audio. This paper
proposes a scheme that improves the robustness of echo hiding. A self-synchronizing code …

Linear feed-forward/feedback shift registers are used as an effective tool of testing circuits in
various fields including built-in self-test and secure scan design. In this paper, we consider …

It is important to find an efficient design-for-testability methodology that satisfies both security
and testability, although there exists an inherent contradiction between security and …

It is important to find an efficient design-for-testability methodology that satisfies both security
and testability though there exists an inherent contradiction between security and testability …

Scan design makes digital circuits easily testable, however, it can also be exploited to be
used for hacking the chip. We have reported a secure and testable scan design approach by …