[HTML][HTML] Canonical variable analysis and long short-term memory for fault diagnosis and performance estimation of a centrifugal compressor

X Li, F Duan, P Loukopoulos, I Bennett… - Control Engineering …, 2018 - Elsevier
Centrifugal compressors are widely used for gas lift, re-injection and transport in the oil and
gas industry. Critical compressors that compress flammable gases and operate at high …

Minimax optimization for recipe management in high-mixed semiconductor lithography process

M Khakifirooz, CF Chien, M Fathi… - IEEE Transactions on …, 2019 - ieeexplore.ieee.org
This article addresses the application of minimax optimization in the control design of
complex dynamic systems of the semiconductor manufacturing. We highlight the main …

Survey on run-to-run control algorithms in high-mix semiconductor manufacturing processes

F Tan, T Pan, Z Li, S Chen - IEEE Transactions on Industrial …, 2015 - ieeexplore.ieee.org
Recently, to ensure product quality in high-mix semiconductor manufacturing processes, run-
to-run (R2R) control algorithms have received increasing attention. Difficult challenges have …

A new double exponentially weighted moving average run-to-run control using a disturbance-accumulating strategy for mixed-product mode

SKS Fan, CH Jen, CY Hsu… - IEEE Transactions on …, 2020 - ieeexplore.ieee.org
Mixed-product production is common practice in semiconductor manufacturing and has
attracted considerable academic attention recently. The main purpose of the mixed-product …

A New Deep Reinforcement Learning Run-to-Run Control Algorithm for Mixed-Product Production Mode in Semiconductor Manufacturing

SKS Fan, TJ Chen - IEEE Transactions on Automation Science …, 2025 - ieeexplore.ieee.org
This paper proposes a new Run-to-Run (R2R) control framework based on deep
deterministic policy gradient (DDPG) for the mixed-product production mode in …

Stability and performance analysis of time-delayed actuator control systems

B Ai, L Sentis, N Paine, S Han… - Journal of …, 2016 - asmedigitalcollection.asme.org
Time delay is a common phenomenon in robotic systems due to computational requirements
and communication properties between or within high-level and low-level controllers as well …

Compensating misalignment using dynamic random-effect control system: A case of high-mixed wafer fabrication

M Khakifirooz, CF Chien, M Fathi - IEEE Transactions on …, 2019 - ieeexplore.ieee.org
It is vital to have an exclusive modification in semiconductor production process because of
meeting differentiated customer demands in dynamic and competitive global minuscule …

Takagi–Sugeno model based analysis of EWMA RtR control of batch processes with stochastic metrology delay and mixed products

Y Zheng, DSH Wong, YW Wang… - IEEE Transactions on …, 2013 - ieeexplore.ieee.org
In many batch-based industrial manufacturing processes, feedback run-to-run control is
used to improve production quality. However, measurements may be expensive and cannot …

Robustness analysis of mixed product run-to-run control for semiconductor process based on ODOB control structure

AC Lee, JH Horng, TW Kuo… - IEEE Transactions on …, 2014 - ieeexplore.ieee.org
In this paper, we propose a unified framework for the mixed-product run-to-run (RtR)
controller, which is called the output disturbance observer (ODOB) structure. Many mixed …

A two-stage clustered multi-task learning method for operational optimization in chemical mechanical polishing

Y Duan, M Liu, M Dong, C Wu - Journal of Process Control, 2015 - Elsevier
Abstract Operational optimization of Chemical Mechanical Polishing, which sets the proper
polishing time, is very important for improving the production efficiency of semiconductor …