With the high demand and sub-nanometer design for integrated circuits, surface defect
complexity and frequency for semiconductor wafers have increased; subsequently …

For decades, industrial companies have been collecting and storing high amounts of data
with the aim of better controlling and managing their processes. However, this vast amount …

This study expands the technical approach that dominates the academic literature on
Industry 4.0, identifying relevant benefits and challenges for its implementation process …

The development of information technology and process technology have been enhanced
the rapid changes in high-tech products and smart manufacturing, specifications become …

A semiconductor distributor that plays a third-party role in the supply chain will buy diverse
components from different suppliers, warehouse and resell them to a number of electronics …

Advancements in technology have made deep learning a hot research area, and we see its
applications in various fields. Its widespread use in silicon wafer defect recognition is …

Wafer bin maps (WBM) provides crucial information regarding process abnormalities and
facilitate the diagnosis of low-yield problems in semiconductor manufacturing. Most studies …

Nowadays, the demand of camera surveillance systems (CSS) has been increasingly
adopted in various industries for smart manufacturing. However, the increase of utilizing …

Wafer bin maps (WBMs) that exhibit systematic defect patterns provide clues for
identification of critical failures that occur during the wafer fabrication process. Proper …

Circuit probe is crucial for electrically testing for functional defects to determine the known
good dies before integrated circuit (IC) packaging. Semiconductor probe forming showing …