[HTML][HTML] Gated-CNN: Combating NBTI and HCI aging effects in on-chip activation memories of Convolutional Neural Network accelerators

NL Muñoz, A Valero, RG Tejero, D Zoni - Journal of Systems Architecture, 2022 - Elsevier
Abstract Negative Bias Temperature Instability (NBTI) and Hot Carrier Injection (HCI) are two
of the main reliability threats in current technology nodes. These aging phenomena degrade …

SRAM stability analysis and performance–reliability tradeoff for different cache configurations

R Zhang, T Liu, K Yang, CC Chen… - IEEE Transactions on …, 2020 - ieeexplore.ieee.org
Bias temperature instability (BTI), hot carrier injection (HCI), gate-oxide time-dependent
dielectric breakdown (GTDDB), and random telegraph noise (RTN) degrade the stability of …

Improving the robustness of redundant execution with register file randomization

I Tuzov, P Andreu, L Medina, T Picornell… - 2021 IEEE/ACM …, 2021 - ieeexplore.ieee.org
Staggered Redundant execution (SRE) is a fault-tolerance mechanism that has been widely
deployed in the context of safety-critical applications. SRE not only protects the system in the …

DC-Patch: A Microarchitectural Fault Patching Technique for GPU Register Files

A Valero, D Suarez-Gracia, R Gran-Tejero - IEEE Access, 2020 - ieeexplore.ieee.org
The ever-increasing parallelism demand of General-Purpose Graphics Processing Unit
(GPGPU) applications pushes toward larger and more energy-hungry register files in …

Kernel-based resource allocation for improving GPU throughput while minimizing the activity divergence of SMs

ZG Tasoulas, I Anagnostopoulos - IEEE Transactions on …, 2019 - ieeexplore.ieee.org
Graphics Processing Units (GPUs) have been established as a major part of modern
computing systems. As technology scales down, GPUs integrate more computing elements …

Synthesis of Register Files for Low-Power Heterogeneous Digital Systems Based on FPGA

DL Oliveira, FF Nascimento, MH Victor… - 2023 IEEE Seventh …, 2023 - ieeexplore.ieee.org
Field Programmable Gated Array (FPGAs) devices are widely used today. Due to their high
integration, FPGAs are used in complex, energy-efficient digital projects. An important …

Gated-CNN: Combating NBTI and HCI aging effects in on-chip activation memories of Convolutional Neural Network accelerators

N Landeros Muñoz, A Valero, D Zoni, R Gran Tejero - 2022 - zaguan.unizar.es
Negative Bias Temperature Instability (NBTI) and Hot Carrier Injection (HCI) are two of the
main reliability threats in current technology nodes. These aging phenomena degrade the …

On microarchitectural mechanisms to combat aging in on-chip memories of convolutional neural networks accelerators

NI LANDEROS MUÑOZ - 2023 - politesi.polimi.it
Abstract Negative Bias Temperature Instability (NBTI) and Hot Carrier Injection (HCI) are two
of the main reliability threats in current technology nodes. These aging phenomena degrade …

RRCD: Redirecci\'on de Registros Basada en Compresi\'on de Datos para Tolerar FallosPermanentes en una GPU

Y Toca-Díaz, A Valero, R Gran-Tejero… - arXiv preprint arXiv …, 2021 - arxiv.org
The ever-increasing parallelism demand of General-Purpose Graphics Processing Unit
(GPGPU) applications pushes toward larger and more energy-hungry register files in …

[PDF][PDF] Tratamiento Antiedad en Aceleradores de Redes Neuronales Convolucionales

NL Munoz, A Valero, R Gran-Tejero, D Zoni - academia.edu
El efecto Negative Bias Temperature Instability (NBTI) es una de las principales amenazas
para la fiabilidad de los nodos tecnológicos actuales. Este fenómeno de envejecimiento …