Improvement of the electron density in the channel of an AlGaAs/GaAs heterojunction by introducing Si δ doping in the quantum well

L Bouzaiene, L Sfaxi, H Sghaeir, H Maaref - Journal of applied physics, 1999 - pubs.aip.org
Over the last decade, an enormous amount of work has been done to understand the
fundamental properties of high electron mobility transistors HEMTs based on …

Monte Carlo simulation of 0.35-mu m gate-length GaAs and InGaAs HEMTs

DH Park, KF Brennan - IEEE transactions on electron devices, 1990 - ieeexplore.ieee.org
A first-principles theoretical comparison of the performances of identical Al/sub 0.32/Ga/sub
0.68/As/GaAs and Al/sub 0.15/Ga/sub 0.15/As/In/sub 0.15/Ga/sub 0.85/As/GaAs …

Theoretical analysis of an Al/sub 0.15/Ga/sub 0.85/As/In/sub 0.15/Ga/sub 0.85/As pseudomorphic HEMT using an ensemble Monte Carlo simulation

DH Park, KF Brennan - IEEE transactions on electron devices, 1989 - ieeexplore.ieee.org
The calculations presented include the full details of the two-dimensional electron gas,
nonstationary transport effects, real-space transfer, and the effects of the two-dimensional …

Capacitance-voltage analysis and current modeling of pulse-doped MODFETs

P Roblin, H Rohdin, CJ Hung… - IEEE transactions on …, 1989 - ieeexplore.ieee.org
The correlation of the capacitance-voltage characteristics of fat MODFETs (FATFETs) to the
current-voltage characteristics of FATFETs and the pulse-doped MODFET is reported. The …

Modeling of MODFETs

G Salmer, J Zimmermann… - IEEE transactions on …, 1988 - ieeexplore.ieee.org
Accurate modeling of MODFETs and of certain novel structures recently proposed requires
that a number of physical phenomena occurring in these devices be considered. Among …

Generation-recombination noise in AlxGa1-xAs

F Hofman, RJJ Zijlstra, JMB De Freitas… - Solid-state electronics, 1991 - Elsevier
The spectral voltage noise intensity was measured in Al x Ga 1-x As epilayers in the
frequency range of 1 Hz–100 kHz and in the temperature range of 77–330 K. The electron …

The role of unintentional acceptor concentration on the threshold voltage of modulation-doped field-effect transistors

RJ Krantz, WL Bloss - IEEE transactions on electron devices, 1989 - ieeexplore.ieee.org
A strong-inversion, depletion-layer model of the threshold voltage for MODFETs has been
used to assess the role of unintentional acceptor doping. For concentrations less than …

Temperature and aluminium composition dependent sheet carrier concentration at AlGaAs/GaAs interface

S Sen, MK Pandey, S Haldar… - Journal of Physics D …, 2000 - iopscience.iop.org
The sheet carrier concentration (two-dimensional electron gas (2DEG), at the AlGaAs/GaAs
interface is analytically modelled with its dependence on temperature (from liquid nitrogen …

Material-related problems in GaAs/GaAlAs modulation-doped heterostructures

S Franchi - Epitaxial electronic materials, 1988 - inis.iaea.org
[en] Modulation doped heterostructures are very interesting advanced structures, which
make it possible to study carrier transport in low dimensionality systems, and to fabricate …

[图书][B] Circuit simulation models for the high electron mobility transistor

KR Cioffi - 1987 - search.proquest.com
The high electron mobility transistor (HEMT) is one of the fastest switching devices available
today. In order to best utilize its capabilities one must be able to simulate its behavior in …