2D fin field-effect transistors integrated with epitaxial high-k gate oxide

C Tan, M Yu, J Tang, X Gao, Y Yin, Y Zhang, J Wang… - Nature, 2023 - nature.com
Precise integration of two-dimensional (2D) semiconductors and high-dielectric-constant (k)
gate oxides into three-dimensional (3D) vertical-architecture arrays holds promise for …

Review of the nanoscale FinFET device for the applications in nano-regime

SU Haq, VK Sharma - Current Nanoscience, 2023 - ingentaconnect.com
Background: The insatiable need for low-power and high-performance integrated circuit (IC)
results in the development of alternative options for metal oxide semiconductor field effect …

Complementary germanium electron–hole bilayer tunnel FET for sub-0.5-V operation

L Lattanzio, L De Michielis… - IEEE Electron Device …, 2011 - ieeexplore.ieee.org
In this letter, we present a novel device, the germanium electron-hole (EH) bilayer tunnel
field-effect transistor, which exploits carrier tunneling through a bias-induced EH bilayer. The …

The electron–hole bilayer tunnel FET

L Lattanzio, L De Michielis, AM Ionescu - Solid-State Electronics, 2012 - Elsevier
We propose a novel tunnel field-effect transistor (TFET) concept called the electron–hole
bilayer TFET (EHBTFET). This device exploits the carrier tunneling through a bias-induced …

Assessment of electron mobility in ultrathin-body InGaAs-on-insulator MOSFETs using physics-based modeling

M Poljak, V Jovanovic, D Grgec… - IEEE transactions on …, 2012 - ieeexplore.ieee.org
We have investigated the electron mobility in ultrathin-body InGaAs-on-insulator devices
using physics-based modeling that self-consistently accounts for quantum confinement and …

[HTML][HTML] Fluorine-based plasmas: main features and application in micro-and nanotechnology and in surface treatment

C Cardinaud - Comptes Rendus Chimie, 2018 - Elsevier
Fluorine cold plasmas produced by an electrical discharge in SF 6, CF 4, CHF 3 or C 4 F 8
gases, principally, have two main fields of application. The first and historical application is …

Atomic layer etching of silicon nitride using infrared annealing for short desorption time of ammonium fluorosilicate

N Miyoshi, H Kobayashi, K Shinoda… - Japanese Journal of …, 2017 - iopscience.iop.org
An atomic layer etching process for silicon nitride (Si 3 N 4) has been developed in which
ammonium fluorosilicate [(NH 4) 2 SiF 6] is formed and desorbed using infrared annealing …

Vertical sidewall of silicon nitride mask and smooth surface of etched-silicon simultaneously obtained using CHF3/O2 inductively coupled plasma

J Sun, Z Chen, S Zhou, Y Sun, Z Liu, C Chen, Y Liu… - Vacuum, 2023 - Elsevier
Silicon nitride (SiN x) has been playing a vital role in the fabrication of micro-and nano-scale
structures in numerous applications for several decades. Optimal etch recipes and a …

Atomic layer etching of Si3N4 with high selectivity to SiO2 and poly-Si

N Miyoshi, K Shinoda, H Kobayashi… - Journal of Vacuum …, 2021 - pubs.aip.org
Atomic layer etching (ALE) is usually classified into ion-driven anisotropic etching or
thermally driven isotropic etching. In this work, we present a thermal ALE process for Si 3 N …

Electron-hole bilayer tunnel FET for steep subthreshold swing and improved ON current

L Lattanzio, L De Michielis… - 2011 Proceedings of the …, 2011 - ieeexplore.ieee.org
We propose a novel Tunnel field-effect transistor (TFET) concept called the electron-hole
bilayer TFET (EHBTFET). This device exploits the carrier tunneling through a bias-induced …