Neuromorphic devices based on fluorite‐structured ferroelectrics

DH Lee, GH Park, SH Kim, JY Park, K Yang… - InfoMat, 2022 - Wiley Online Library
A continuous exponential rise has been observed in the storage and processing of the data
that may not curtail in the foreseeable future. The required data processing speed and …

Ferroelectricity of hafnium oxide-based materials: Current status and future prospects from physical mechanisms to device applications

W Yang, C Yu, H Li, M Fan, X Song, H Ma… - Journal of …, 2023 - iopscience.iop.org
The finding of the robust ferroelectricity in HfO 2-based thin films is fantastic from the view
point of both the fundamentals and the applications. In this review article, the current …

Ferroelectricity in CMOS-compatible hafnium oxides: Reviving the ferroelectric field-effect transistor technology

D Das, AI Khan - IEEE Nanotechnology Magazine, 2021 - ieeexplore.ieee.org
A Ferroelectric Field-Effect Transistor (FEFET) is a promising candidate for next-generation
memory devices because it offers numerous advantages, such as its high speed, low energy …

Impact of domain wall motion on the memory window in a multidomain ferroelectric FET

N Pandey, YS Chauhan - IEEE Electron Device Letters, 2022 - ieeexplore.ieee.org
This letter studies the impact of multi-domain dynamics on the memory window (MW) of a
Ferroelectric FET (FeFET). The memory window primarily depends on the density of …

A compact model of ferroelectric field-effect transistor

CT Tung, G Pahwa, S Salahuddin… - IEEE Electron Device …, 2022 - ieeexplore.ieee.org
In this letter, we present a compact model of ferroelectric field-effect-transistor (FEFET). The
model consists of a ferroelectric (FE) capacitor model and a Berkeley Short-channel IGFET …

Phase-field simulations of polarization variations in polycrystalline Hf0. 5Zr0. 5O2 based MFIM: Voltage dependence and dynamics

R Koduru, I Ahmed, AK Saha, X Lyu, P Ye… - Journal of Applied …, 2023 - pubs.aip.org
In this work, we investigate the device-to-device variations in the remanent polarization of
metal–ferroelectric–insulator–metal stacks based on ferroelectric hafnium–zirconium–oxide …

An alternative way for reconfigurable logic-in-memory with ferroelectric FET

WX You, BK Huang, P Su - IEEE Transactions on Electron …, 2021 - ieeexplore.ieee.org
Single ferroelectric-FET (FeFET) reconfigurable logic-in-memory is an attractive beyond-von-
Neumann scheme for data-centric computing. Different from using body-to-source voltage to …

Impact of temperature on threshold voltage instability under negative bias in ferroelectric charge trap (FEG) GaN-HEMT

SK Rathaur, A Dixit, EY Chang - Applied Physics Letters, 2024 - pubs.aip.org
This Letter pioneers an investigation into the influence of temperature on threshold voltage
(V TH) instability under negative bias in ferroelectric charge trap gate stack (FEG) high …

Experimental Investigation of Variations in Polycrystalline Hf0. 5Zr0. 5O2 (HZO)-based MFIM

TR Kim, R Koduru, Z Lin, P Ye, SK Gupta - arXiv preprint arXiv …, 2024 - arxiv.org
Device-to-device variations in ferroelectric (FE) hafnium oxide-based devices pose a crucial
challenge that limits the otherwise promising capabilities of this technology. Earlier …

Ferroelectric Hafnium Nitride Thin Films Directly Formed on Si (100) Substrate

S Ohmi, Y Ohtaguchi, A Ihara… - IEEE Journal of the …, 2021 - ieeexplore.ieee.org
We have investigated the ferroelectric hafnium nitride (HfN) thin films directly formed on the
Si (100) substrate for the metal-ferroelectrics-Si field-effect transistor (MFSFET) applications …