Bias temperature instability and junction temperature measurement using electrical parameters in SiC power MOSFETs

JO Gonzalez, O Alatise - IEEE Transactions on Industry …, 2020 - ieeexplore.ieee.org
Junction temperature sensing is an integral part of both online and offline condition
monitoring where direct access to the bare die surface is not available. Given a defined …

[HTML][HTML] Carbon cluster formation and mobility degradation in 4H-SiC MOSFETs

Z Zhang, Z Wang, Y Guo, J Robertson - Applied Physics Letters, 2021 - pubs.aip.org
The performance of SiC MOSFETs is limited by many defects at the SiC/SiO 2 interface.
However, there are no fully consistent atomic models of these defects or how their large …

Impact of BTI-induced threshold voltage shifts in shoot-through currents from crosstalk in SiC MOSFETs

JO Gonzalez, O Alatise - IEEE Transactions on Power …, 2020 - ieeexplore.ieee.org
In this article, a method for evaluating the implications of threshold voltage (VTH) drift from
gate voltage stress in SiC MOSFETs is presented. By exploiting the Miller coupling between …

[HTML][HTML] Synthesis Si nanoparticles from rice husk as material active electrode on secondary cell battery with X-Ray diffraction analysis

A Daulay, S Gea - South African Journal of Chemical Engineering, 2022 - Elsevier
Si nanoparticles have been synthesized from rice husk. Adding KBr during the reduction of
the magnesiothermic method in the synthesis of Si nanoparticles is effective as a scavenger …

[HTML][HTML] A Review of Wide Bandgap Semiconductors: Insights into SiC, IGZO, and Their Defect Characteristics

Q Shangguan, Y Lv, C Jiang - Nanomaterials, 2024 - pmc.ncbi.nlm.nih.gov
Although the irreplaceable position of silicon (Si) semiconductor materials in the field of
information has become a consensus, new materials continue to be sought to expand the …

Conduction mechanism and UV/visible photodetection properties of p-Si/n-SiC heterostructure

BC Şakar, F Yıldırım, Z Orhan, Ş Aydoğan - Optical and Quantum …, 2023 - Springer
This study examines the electrical and optical properties of p-Si/n-SiC heterojunctions
subjected to UV and visible light in addition to the conduction mechanism of the device. The …

Au grating on SiC substrate: simulation of high performance plasmonic Schottky barrier photodetector in visible and NIR regions

AK Sharma, AK Pandey - Journal of Physics D: Applied Physics, 2020 - iopscience.iop.org
Plasmonically enhanced light absorption in Schottky barrier photodetectors (PDs) can be
achieved by engineering metallic nanostructures. In this context, gold (Au) gratings on …

Mechanism of threshold voltage instability in SiC MOSFETs and impacts on dynamic switching

J Jiang, M Tian, W Ji, Z Hu, H Li, Y Guo… - … Devices and ICs …, 2023 - ieeexplore.ieee.org
The threshold voltage (V_TH) instability of silicon carbon (SiC) metal-oxide semiconductor
field-effect transistors (MOSFETs) are investigated by pulsed bias characterizations. The …

[HTML][HTML] Effect of surface treatments on ALD Al2O3/4H-SiC metal–oxide–semiconductor field-effect transistors

IU Jayawardhena, RP Ramamurthy… - Journal of Applied …, 2021 - pubs.aip.org
Silicon carbide (4H) based metal–oxide–semiconductor field-effect transistors provide
capabilities in high power and high temperature inaccessible to silicon. However, the …

Atomic scale localization of Kohn–Sham wavefunction at SiO2/4H–SiC interface under electric field, deviating from envelope function by effective mass approximation

H Yoshioka, JI Iwata, Y Matsushita - Applied Physics Letters, 2023 - pubs.aip.org
To clarify the cause of the low channel conductivity at the SiO 2/4H–SiC interface, the
wavefunction at the SiC conduction band minimum was calculated using density functional …