Supervised Domain Adaptation for Surface Defect Detection Leveraging Partial Data Availability

I Heider, J Baumgärtner, P Bartz… - 2024 IEEE 20th …, 2024 - ieeexplore.ieee.org
Defect detection in manufacturing applications using Deep Learning (DL) faces industry-
specific challenges. The general scarcity of data is characteristic of the manufacturing sector …