Identification of electronic intermolecular electrostatic interactions that can significantly
enhance poling-induced order is important to the advancement of the field of organic electro …

Optical properties of thin films and bulk materials at short wavelengths, including 157 nm
and shorter, are needed for development of new lithographic processes, new fundamental …

We perform characterization of thin films and reverse engineering of multilayer coatings on
the basis of multiangle spectral photometric data provided by a new advanced …

The optical properties of CuIn 1− x Ga x Se 2 epitaxial single-crystal layers were determined
by spectroscopic ellipsometry (SE) and complementary photoreflectance spectroscopy (PR) …

The dielectric function ε (ω) of polycrystalline bulk samples of the quaternary chalcopyrite
semiconductors Ag 1− x Cu x In Se 2 with x= 0.0, 0.2, 0.4, 0.6, 0.8, 1.0 has been determined …

Two algorithms used for the on-line and off-line characterization of multilayer optical
coatings are experimentally compared using test samples produced by two different …

The design of adhesively bonded structures requires accurate material property data. These
data, which are often best obtained from bulk test specimens, can provide an indication of a …

The design of adhesively bonded structures requires accurate material property data. These
data are often best obtained from bulk test specimens. Such data can give an indication of …

Sartori (57) ABSTRACT With extremely-thin-film and thin-film measurement, mod els are
formed based upon a combination of film thickness, optical constants obtained using the …

In modern semiconductor manufacturing ion implantation requires precise control and such
a control is impossible without adequate measurements of the implanted media. As the …