High‐Quality and Wafer‐Scale Cubic Silicon Carbide Single Crystals

G Wang, D Sheng, Y Yang, H Li, C Chai… - Energy & …, 2023 - Wiley Online Library
Cubic silicon carbide (3C‐SiC) has superior mobility and thermal conduction over that of
widely applied hexagonal 4H‐SiC. Moreover, much lower concentration of interfacial traps …

Structural characteristics of 3C–SiC thin films grown on Si-face and C-face 4H–SiC substrates by high temperature chemical vapor deposition

ZC Feng, HH Lin, B Xin, SJ Tsai, V Saravade, J Yiin… - Vacuum, 2023 - Elsevier
Hetero-epitaxy of 3C–SiC on Si-face and C-face 4H–SiC is experimentally investigated and
corresponding growth model is identified. This study of polytypes of SiC will be useful for …

A comparative study of high-quality C-face and Si-face 3C-SiC (1 1 1) grown on off-oriented 4H-SiC substrates

Y Shi, V Jokubavicius, P Höjer, IG Ivanov… - Journal of Physics D …, 2019 - iopscience.iop.org
We present a comparative study of the C-face and Si-face of 3C-SiC (111) grown on off-
oriented 4H-SiC substrates by the sublimation epitaxy. By the lateral enlargement method …

Morphological and electronic properties of epitaxial graphene on SiC

R Yakimova, T Iakimov, GR Yazdi, C Bouhafs… - Physica B: Condensed …, 2014 - Elsevier
We report on the structural and electronic properties of graphene grown on SiC by high-
temperature sublimation. We have studied thickness uniformity of graphene grown on 4H …

Double-position-boundaries free 3C-SiC epitaxial layers grown on on-axis 4H-SiC

X Li, H Jacobson, A Boulle… - ECS Journal of Solid …, 2014 - iopscience.iop.org
High quality double-position-boundaries free 3C-SiC epilayers have been successfully
grown on on-axis (0001) 4H-SiC by chemical vapor deposition at optimized conditions as …

Large-area microfocal spectroscopic ellipsometry mapping of thickness and electronic properties of epitaxial graphene on Si-and C-face of 3C-SiC (111)

V Darakchieva, A Boosalis, AA Zakharov… - Applied Physics …, 2013 - pubs.aip.org
Microfocal spectroscopic ellipsometry mapping of the electronic properties and thickness of
epitaxial graphene grown by high-temperature sublimation on 3C-SiC (111) substrates is …

Ultrafine Si evaporation control technology to inhibit the island nucleation of epitaxial graphene on SiC (000-1)

F Zhu, Y Jia, X Sun, Y Chen, Z Shi, S Lv, M Liu… - Journal of Crystal …, 2024 - Elsevier
The theoretically high mobility of graphene on C-terminated face of silicon carbide (SiC (000-
1)) makes it a suitable candidate for electronic devices. However, the quality of graphene …

Analysis of the spiral step structure and the initial solution growth behavior of SiC by real-time observation of the growth interface

S Kawanishi, M Kamiko, T Yoshikawa… - Crystal Growth & …, 2016 - ACS Publications
Microscopic real-time observation of the solution growth interface of SiC using Fe–Si solvent
at 1673 K was successfully performed to understand the interface morphology at the initial …

Nonlinear optical imaging of defects in cubic silicon carbide epilayers

R Hristu, SG Stanciu, DE Tranca, A Matei… - Scientific reports, 2014 - nature.com
Silicon carbide is one of the most promising materials for power electronic devices capable
of operating at extreme conditions. The widespread application of silicon carbide power …

Quantitative analysis of contact angle of water on SiC: polytype and polarity dependence

JG Kim, WS Yoo, JY Park, WJ Lee - ECS Journal of Solid State …, 2020 - iopscience.iop.org
A SiC crystal mixed with 4H-, 6H-, and 15R-SiC polytypes and their wetting properties were
characterized using precisely dispensed de-ionized (DI) water drops. Contact angles of a DI …