An overview of non-destructive testing methods for integrated circuit packaging inspection

P Aryan, S Sampath, H Sohn - Sensors, 2018 - mdpi.com
The article provides a review of the state-of-art non-destructive testing (NDT) methods used
for evaluation of integrated circuit (IC) packaging. The review identifies various types of the …

Advances in thermal conductivity for energy applications: a review

Q Zheng, M Hao, R Miao, J Schaadt… - Progress in Energy, 2021 - iopscience.iop.org
Thermal conductivity is a crucial material property for a diverse range of energy
technologies, ranging from thermal management of high power electronics to thermal …

Monolithic integration of all‐in‐one supercapacitor for 3D electronics

Y Wang, S Su, L Cai, B Qiu, N Wang… - Advanced Energy …, 2019 - Wiley Online Library
A supercapacitor is usually stacked in the configuration of a layered sandwiched
architecture, and has been adopted as discrete energy storage device or circuit component …

Anti-oxidant copper layer by remote mode N2 plasma for low temperature copper–copper bonding

H Park, H Seo, SE Kim - Scientific reports, 2020 - nature.com
An anti-oxidant Cu layer was achieved by remote mode N2 plasma. Remote mode plasma
treatment offers the advantages of having no defect formation, such as pinholes, by …

A thermomechanical constitutive model for investigating the fatigue behavior of Sn‐rich solder under thermal cycle loading

Z Zhang, S Liu, K Ma, T Shi, Z Qian… - Fatigue & Fracture of …, 2022 - Wiley Online Library
Based on crystal plastic theory, a novel thermomechanical constitutive model was proposed
for Sn‐rich solder. Material parameters of the proposed constitutive model were determined …

Multidimensional vision sensors for information processing

Z Wang, T Wan, S Ma, Y Chai - Nature Nanotechnology, 2024 - nature.com
The visual scene in the physical world integrates multidimensional information (spatial,
temporal, polarization, spectrum and so on) and typically shows unstructured characteristics …

Failure Mechanisms of Cu–Cu bumps under thermal cycling

KC Shie, PN Hsu, YJ Li, DP Tran, C Chen - Materials, 2021 - mdpi.com
The failure mechanisms of Cu–Cu bumps under thermal cycling test (TCT) were
investigated. The resistance change of Cu–Cu bumps in chip corners was less than 20 …

Intelligent Design and Tuning Method for Embedded Thermoelectric Cooler (TEC) in 3D Integrated Microsystems

P Zhang, DW Wang, WS Zhao, B You… - IEEE Transactions …, 2023 - ieeexplore.ieee.org
In this article, a genetic algorithm (GA)-based optimal design of thermoelectric cooler (TEC)
and a hybrid Bayesian optimization (BO)-artificial neural network (ANN)-based tuning …

A W-band 3-D integrated mini-SAR system with high imaging resolution on UAV platform

ML Ding, CB Ding, L Tang, XM Wang, JM Qu… - IEEE Access, 2020 - ieeexplore.ieee.org
The light-small multi-rotor unmanned aerial vehicle (UAV) carrying with a mini synthetic
aperture radar (SAR) payload has provided an advanced information acquisition technology …

Intermediate low-melting-temperature solder thermal cycling enhancement using bismuth and indium microalloying

YW Lee, TK Lee, JP Jung - Journal of Electronic Materials, 2023 - Springer
Abstract In general, Sn-Ag-Cu solder is widely used for interconnections in semiconductor
device packaging. However, recently, several factors have been considered to implement …