Since the middle of the 1990s, X-ray phase imaging including phase tomography has been
attracting increasing attention. The advantage of X-ray phase imaging is that an extremely …

Instabilities in semiconductor heterostructure growth can be exploited for the self-organized
formation of nanostructures, allowing for carrier confinement in all three spatial dimensions …

In this paper, we demonstrate that the shift between similar features in two electron
backscatter diffraction (EBSD) patterns can be measured using cross-correlation based …

Advanced materials and processing techniques are based largely on the generation and
control of non-homogeneous microstructures, such as precipitates and grain boundaries. X …

During the last 20 years interest in high-resolution x-ray diffractometry and reflectivity has
grown as a result of the development of the semiconductor industry and the increasing …

Synchrotron radiation (SR) is having a very large impact on interdisciplinary science and
has been tremendously successful with the arrival of third generation synchrotron x-ray …

Due to economical demands to further increase the efficiency of production processes, it is
essential to exploit the full potential of wear resistant hard coatings. This is, however …

Scanning X-ray microdiffraction (µSXRD) combines the use of high-brilliance synchrotron
sources with the latest achromatic X-ray focusing optics and fast large-area two-dimensional …

Convergent beam electron diffraction (CBED), nano-beam electron diffraction (NBED or
NBD), high resolution imaging (HRTEM and HRSTEM) and dark field electron holography …

A novel synchrotron X-ray nanodiffraction approach for the quantitative characterization of
strain and microstructure depth gradients in nanocrystalline thin films is introduced …