Plant bioelectronics and biohybrids: the growing contribution of organic electronic and carbon-based materials

G Dufil, I Bernacka-Wojcik, A Armada-Moreira… - Chemical …, 2021 - ACS Publications
Life in our planet is highly dependent on plants as they are the primary source of food,
regulators of the atmosphere, and providers of a variety of materials. In this work, we review …

Reliability issue related to dielectric charging in capacitive micromachined ultrasonic transducers: A review

J Munir, Q Ain, HJ Lee - Microelectronics Reliability, 2019 - Elsevier
The long-term reliability of MEMS devices related to the dielectric charging phenomenon is
one of the main hurdles in the commercialization of these devices. This paper presents a …

On the influence of environment gases, relative humidity and gas purification on dielectric charging/discharging processes in electrostatically driven MEMS/NEMS …

U Zaghloul, B Bhushan, P Pons… - …, 2010 - iopscience.iop.org
In this paper, we investigate the impact of environment gases and relative humidity on
dielectric charging phenomenon in electrostatically actuated micro-and nano …

Nanoscale characterization of different stiction mechanisms in electrostatically driven MEMS devices based on adhesion and friction measurements

U Zaghloul, B Bhushan, P Pons… - Journal of colloid and …, 2011 - Elsevier
In this work, for the first time different stiction mechanisms in electrostatic micro-
electromechanical systems (MEMS) switches were studied. In these devices stiction can be …

Dielectric charging induced drift in micro device reliability-a review

W Zhou, J He, X He, H Yu, B Peng - Microelectronics reliability, 2016 - Elsevier
The movement or migration of charges in dielectric materials like silicon oxide, silicon nitride
and glass, is recognized as one of the most significant causes of drift instability of MEMS …

Nanoscale characterization of the dielectric charging phenomenon in PECVD silicon nitride thin films with various interfacial structures based on Kelvin probe force …

U Zaghloul, GJ Papaioannou, H Wang… - …, 2011 - iopscience.iop.org
This work presents a novel characterization methodology for the dielectric charging
phenomenon in electrostatically driven MEMS devices using Kelvin probe force microscopy …

Effect of deposition gas ratio, RF power, and substrate temperature on the charging/discharging processes in PECVD silicon nitride films for electrostatic NEMS/MEMS …

U Zaghloul, GJ Papaioannou… - Journal of …, 2011 - ieeexplore.ieee.org
The dependence of the electrical properties of silicon nitride, which is a commonly used
dielectric in nano-and micro-electromechanical systems (NEMS and MEMS), on the …

A novel low cost failure analysis technique for dielectric charging phenomenon in electrostatically actuated MEMS devices

U Zaghloul, F Coccetti, GJ Papaioannou… - 2010 IEEE …, 2010 - ieeexplore.ieee.org
This work presents a novel failure analysis technique for the dielectric charging
phenomenon in electrostatically driven MEMS devices. The new reliability assessment …

Nondestructive Evaluation of Urethane-Ester Coating Systems Using the Scanning Kelvin Probe Technique

DJ Borth, EB Iezzi, DS Dudis, DC Hansen - Corrosion, 2019 - meridian.allenpress.com
This research examines the effect of hydrolytic decomposition on the work function of
polyurethane-ester rain erosion coatings (REC). Aluminum panels (AA2024-T3) coated with …

An improvement proposal for mismatch condition problem in dragon test system

E Marcelo Sy - 2018 - repositorio.cetys.mx
RF final test measurements include the DC to RF performance of components and are
therefore included on the system offsets measurements to compensate for the deviations …