Temperature measurement of power semiconductor devices by thermo-sensitive electrical parameters—A review

Y Avenas, L Dupont, Z Khatir - IEEE transactions on power …, 2011 - ieeexplore.ieee.org
This paper proposes a synthesis of different electrical methods used to estimate the
temperature of power semiconductor devices. The following measurement methods are …

Temperature measurements of semiconductor devices-a review

DL Blackburn - … and Management Symposium (IEEE Cat. No …, 2004 - ieeexplore.ieee.org
There are numerous methods for measuring the temperature of an operating semiconductor
device. The methods can be broadly placed into three generic categories: electrical, optical …

Comparison of junction temperature evaluations in a power IGBT module using an IR camera and three thermosensitive electrical parameters

L Dupont, Y Avenas, PO Jeannin - IEEE Transactions on …, 2013 - ieeexplore.ieee.org
The measurement of the junction temperature with thermosensitive electrical parameters
(TSEPs) is largely used by electrical engineers or researchers, but the obtained temperature …

[图书][B] Insulated gate bipolar transistor IGBT theory and design

VK Khanna - 2004 - books.google.com
Page 1 THE INSULATED GATE BIPOLAR TRANSISTOR IGBT THEORY AND DESIGN Vinod
Kumar Khanna IEEE IEEE PRESS WILEYINTERSCIENCE A JOHN WILEY & SONS, INC …

A review of IGBT models

K Sheng, BW Williams, SJ Finney - IEEE transactions on Power …, 2000 - ieeexplore.ieee.org
In this paper, insulated gate bipolar transistor (IGBT) models published in the literature are
reviewed, analyzed, compared and classified into different categories according to …

Investigation into IGBT dV/dt during turn-off and its temperature dependence

A Bryant, S Yang, P Mawby, D Xiang… - … on Power Electronics, 2011 - ieeexplore.ieee.org
In many power converter applications, particularly those with high variable loads, such as
traction and wind power, condition monitoring of the power semiconductor devices in the …

Accurate Temperature Estimation of SiC Power mosfets Under Extreme Operating Conditions

A Tsibizov, I Kovačević-Badstübner… - … on Power Electronics, 2019 - ieeexplore.ieee.org
Electrothermal modeling of silicon carbide (SiC) power devices is frequently performed to
estimate the device temperature in operation, typically assuming a constant thermal …

Ensuring a reliable operation of two-level IGBT-based power converters: A review of monitoring and fault-tolerant approaches

K Hu, Z Liu, Y Yang, F Iannuzzo, F Blaabjerg - IEEE Access, 2020 - ieeexplore.ieee.org
Despite the emerging multi-phase and multi-level converters, two-level insulated gate
bipolar transistor-based power converters are still widely used in industrial applications in …

A real-time thermal model for monitoring of power semiconductor devices

TK Gachovska, B Tian, JL Hudgins… - IEEE Transactions …, 2015 - ieeexplore.ieee.org
A resistance-capacitance (RC) thermal network with temperature-dependent thermal
conductivities and heat capacitances is used to calculate the junction temperature of …

Choosing a thermal model for electrothermal simulation of power semiconductor devices

A Ammous, S Ghedira, B Allard… - IEEE transactions on …, 1999 - ieeexplore.ieee.org
The literature proposes some thermal models needed for the electrothermal simulation of
power electronic systems. This paper gives a useful analysis about the choice of the thermal …