Advances in ultrashallow doping of silicon

C Zhang, S Chang, Y Dan - Advances in Physics: X, 2021 - Taylor & Francis
Ultrashallow doping is required for both classical field-effect transistors in integrated circuits
and revolutionary quantum devices in quantum computing. In this review, we give a brief …

Suppressing segregation in highly phosphorus doped silicon monolayers

JG Keizer, S Koelling, PM Koenraad, MY Simmons - ACS nano, 2015 - ACS Publications
Sharply defined dopant profiles and low resistivity are highly desired qualities in the
microelectronic industry, and more recently, in the development of an all epitaxial Si: P …

Observation and origin of the manifold in Si:P layers

AJ Holt, SK Mahatha, RM Stan, FS Strand, T Nyborg… - Physical Review B, 2020 - APS
By creating a sharp and dense dopant profile of phosphorus atoms buried within a silicon
host, a two-dimensional electron gas is formed within the dopant region. Quantum …

Quantifying atom-scale dopant movement and electrical activation in Si: P monolayers

X Wang, JA Hagmann, P Namboodiri, J Wyrick, K Li… - Nanoscale, 2018 - pubs.rsc.org
Advanced hydrogen lithography techniques and low-temperature epitaxial overgrowth
enable the patterning of highly phosphorus-doped silicon (Si: P) monolayers (ML) with …

Epitaxial top-gated atomic-scale silicon wire in a three-dimensional architecture

SR McKibbin, G Scappucci, W Pok… - Nanotechnology, 2013 - iopscience.iop.org
Abstract Three-dimensional (3D) control of dopant profiles in silicon is a critical requirement
for fabricating atomically precise transistors. We demonstrate conductance modulation …

Valley splitting in a silicon quantum device platform

JA Miwa, O Warschkow, DJ Carter, NA Marks… - Nano …, 2014 - ACS Publications
By suppressing an undesirable surface Umklapp process, it is possible to resolve the two
most occupied states (1Γ and 2Γ) in a buried two-dimensional electron gas (2DEG) in …

Disentangling phonon and impurity interactions in δ-doped Si (001)

F Mazzola, CM Polley, JA Miwa, MY Simmons… - Applied Physics …, 2014 - pubs.aip.org
We present a study of the phonon and impurity interactions in a shallow two dimensional
electron gas formed in Si (001). A highly conductive ultra-narrow n-type dopant δ-layer …

The impact of dopant segregation on the maximum carrier density in Si: P multilayers

JG Keizer, SR McKibbin, MY Simmons - ACS nano, 2015 - ACS Publications
Abrupt dopant profiles and low resistivity are highly sought after qualities in the silicon
microelectronics industry and, more recently, in the development of an all epitaxial Si: P …

Phosphorus atomic layer doping of germanium by the stacking of multiple δ layers

G Scappucci, G Capellini, WM Klesse… - …, 2011 - iopscience.iop.org
In this paper we demonstrate the fabrication of multiple, narrow, and closely spaced δ-doped
P layers in Ge. The P profiles are obtained by repeated phosphine adsorption onto …

Electronic structure of two interacting phosphorus -doped layers in silicon

DJ Carter, O Warschkow, NA Marks… - Physical Review B …, 2013 - APS
Density functional theory is used to quantify the interaction of a pair of 1 4-monolayer
phosphorus δ-doped layers in silicon. We investigate changes in the electronic structure as …