Sharply defined dopant profiles and low resistivity are highly desired qualities in the microelectronic industry, and more recently, in the development of an all epitaxial Si: P …
AJ Holt, SK Mahatha, RM Stan, FS Strand, T Nyborg… - Physical Review B, 2020 - APS
By creating a sharp and dense dopant profile of phosphorus atoms buried within a silicon host, a two-dimensional electron gas is formed within the dopant region. Quantum …
Abstract Three-dimensional (3D) control of dopant profiles in silicon is a critical requirement for fabricating atomically precise transistors. We demonstrate conductance modulation …
By suppressing an undesirable surface Umklapp process, it is possible to resolve the two most occupied states (1Γ and 2Γ) in a buried two-dimensional electron gas (2DEG) in …
We present a study of the phonon and impurity interactions in a shallow two dimensional electron gas formed in Si (001). A highly conductive ultra-narrow n-type dopant δ-layer …
Abrupt dopant profiles and low resistivity are highly sought after qualities in the silicon microelectronics industry and, more recently, in the development of an all epitaxial Si: P …
In this paper we demonstrate the fabrication of multiple, narrow, and closely spaced δ-doped P layers in Ge. The P profiles are obtained by repeated phosphine adsorption onto …
Density functional theory is used to quantify the interaction of a pair of 1 4-monolayer phosphorus δ-doped layers in silicon. We investigate changes in the electronic structure as …