Mapping the mechanical action of light
DC Kohlgraf-Owens, S Sukhov, A Dogariu - Physical Review A—Atomic …, 2011 - APS
Mapping the mechanical action of light Page 1 RAPID COMMUNICATIONS PHYSICAL
REVIEW A 84, 011807(R) (2011) Mapping the mechanical action of light Dana C. Kohlgraf-Owens …
REVIEW A 84, 011807(R) (2011) Mapping the mechanical action of light Dana C. Kohlgraf-Owens …
Optical-force-induced artifacts in scanning probe microscopy
DC Kohlgraf-Owens, S Sukhov, A Dogariu - Optics letters, 2011 - opg.optica.org
In the practice of near-field scanning probe microscopy, it is typically assumed that the
distance regulation is independent of the optical signal. However, we demonstrate that these …
distance regulation is independent of the optical signal. However, we demonstrate that these …
Discrimination of field components in optical probe microscopy
DC Kohlgraf-Owens, S Sukhov, A Dogariu - Optics Letters, 2012 - opg.optica.org
We demonstrate that the conventional optical signal in near-field scanning optical
microscopy and the optical force induced topography contain complementary information …
microscopy and the optical force induced topography contain complementary information …
Optically induced forces in scanning probe microscopy
DC Kohlgraf-Owens, S Sukhov, L Greusard… - …, 2014 - degruyter.com
Typical measurements of light in the near-field utilize a photodetector such as a
photomultiplier tube or a photodiode, which is placed remotely from the region under test …
photomultiplier tube or a photodiode, which is placed remotely from the region under test …
Investigation of an n− layer in a silicon fast recovery diode under applied bias voltages using Kelvin probe force microscopy
T Uruma, N Satoh, H Yamamoto… - Japanese Journal of …, 2018 - iopscience.iop.org
We have imaged an n− layer of a commercial silicon fast recovery diode (Si-FRD) under
applied bias voltages using frequency modulation atomic force microscopy and Kelvin probe …
applied bias voltages using frequency modulation atomic force microscopy and Kelvin probe …
Photo radiation pressure at resonance of frequency modulated micro cantilever
We demonstrated high-sensitivity measurement of photo-radiation pressure by applying
frequency modulation (FM) detection for the resonance phenomenon of the microcantilever …
frequency modulation (FM) detection for the resonance phenomenon of the microcantilever …
Optical and mechanical detection of near-field light by atomic force microscopy using a piezoelectric cantilever
N Satoh, K Kobayashi, S Watanabe… - Japanese Journal of …, 2016 - iopscience.iop.org
In this study, we developed an atomic force microscopy (AFM) system with scanning near-
field optical microscopy (SNOM) using a microfabricated force-sensing cantilever with a lead …
field optical microscopy (SNOM) using a microfabricated force-sensing cantilever with a lead …
Near-field light detection of a photo induced force by atomic force microscopy with frequency modulation
N Satoh, K Kobayashi, K Matsushige… - Japanese Journal of …, 2017 - iopscience.iop.org
We demonstrated near-field light detection using a non contact-mode atomic force
microscope (nc-AFM). This system obtains molecular-level resolution by reducing noise in …
microscope (nc-AFM). This system obtains molecular-level resolution by reducing noise in …
Optical forces in scanning probe microscopy
DC Kohlgraf-Owens, S Sukhov… - Quantum Electronics and …, 2011 - opg.optica.org
OptForces - merge v1 Page 1 Optical Forces in Scanning Probe Microscopy Dana C.
Kohlgraf-Owens, Sergey Sukhov, Aristide Dogariu CREOL & FPCE, The College of Optics and …
Kohlgraf-Owens, Sergey Sukhov, Aristide Dogariu CREOL & FPCE, The College of Optics and …