JPS Wong, A Epstein… - IEEE Antennas and …, 2015 - ieeexplore.ieee.org
We hereby report a solution to the problem of reflections from passive lossless refracting metasurfaces that works even at wide deflection angles. The phenomenon of reflections is …
DE Root - IEEE microwave magazine, 2006 - ieeexplore.ieee.org
For more than a quarter of a century, microwave engineers have had the benefit of a foundation of mutually interacting components of measurement, modeling, and simulation to …
Wireless Power Transfer is the second edition of a well received first book, which published in 2012. It represents the state-of-the-art at the time of writing, and addresses a unique …
A powerful new verification technique determines the measurement accuracy of scattering parameter calibrations. The technique determines the relative reference impedance …
M Naftaly, RG Clarke, DA Humphreys… - Proceedings of the …, 2017 - ieeexplore.ieee.org
The two main modalities for making broadband phase-sensitive measurements at terahertz (THz) frequencies are vector network analyzers (VNA) and time-domain spectrometers …
The purpose of this invited paper is to give readers a critical and comprehensive overview on how to extract dielectric properties of a bioliquid within a broad frequency range. Two …
We describe the design, fabrication, and evaluation of a new on-wafer measurement platform for the rapid and quantitative determination of the complex permittivity of nanoliter …
RB Marks - 50th ARFTG Conference Digest, 1997 - ieeexplore.ieee.org
This paper explores details of the relationship between two expressions of the basic error model describing a two-port vector network analyzer (VNA). One of these formulations is the …
This technical note is an introductory overview of dielectric and magnetic measurement metrology on packaging materials. Dielectric materials have many important functions in the …