[HTML][HTML] Resistance random access memory

TC Chang, KC Chang, TM Tsai, TJ Chu, SM Sze - Materials Today, 2016 - Elsevier
Non-volatile memory (NVM) will play a decisive role in the development of the next-
generation of electronic products. Therefore, the development of next-generation NVM is …

Epsilon-near-zero photonics: infinite potentials

J Wu, ZT Xie, Y Sha, HY Fu, Q Li - Photonics Research, 2021 - opg.optica.org
With its unique and exclusive linear and nonlinear optical characteristics, epsilon-near-zero
(ENZ) photonics has drawn a tremendous amount of attention in the recent decade in the …

Physical and chemical mechanisms in oxide-based resistance random access memory

KC Chang, TC Chang, TM Tsai, R Zhang… - Nanoscale research …, 2015 - Springer
In this review, we provide an overview of our work in resistive switching mechanisms on
oxide-based resistance random access memory (RRAM) devices. Based on the …

Complementary resistive switching behavior induced by varying forming current compliance in resistance random access memory

YT Tseng, TM Tsai, TC Chang, CC Shih… - Applied Physics …, 2015 - pubs.aip.org
In this study of resistance random access memory in a resistive switching film, the
breakdown degree was controlled by varying forming current compliance. A SiO x layer was …

Manipulation of epsilon-near-zero wavelength for the optimization of linear and nonlinear absorption by supercritical fluid

J Wu, X Liu, H Fu, KC Chang, S Zhang, HY Fu, Q Li - Scientific Reports, 2021 - nature.com
We introduce supercritical fluid (SCF) technology to epsilon-near-zero (ENZ) photonics for
the first time and experimentally demonstrate the manipulation of the ENZ wavelength for the …

Resistive switching mechanism of oxygen-rich indium tin oxide resistance random access memory

TM Tsai, KC Chang, TC Chang, R Zhang… - IEEE Electron …, 2016 - ieeexplore.ieee.org
This letter investigates the double-ended resistive switching characteristics of indium tin
oxide (ITO) resistance random access memory (RRAM). Resistive switching can be …

Characteristics of hafnium oxide resistance random access memory with different setting compliance current

YT Su, KC Chang, TC Chang, TM Tsai, R Zhang… - Applied Physics …, 2013 - pubs.aip.org
In this Letter, the characteristics of set process of hafnium oxide based resistance random
access memory are investigated by different set processes with increasing compliance …

High‐performance flexible organic nano‐floating gate memory devices functionalized with cobalt ferrite nanoparticles

JH Jung, S Kim, H Kim, J Park, JH Oh - Small, 2015 - Wiley Online Library
Nano‐floating gate memory (NFGM) devices are transistor‐type memory devices that use
nanostructured materials as charge trap sites. They have recently attracted a great deal of …

Resistance switching induced by hydrogen and oxygen in diamond-like carbon memristor

YJ Chen, KC Chang, TC Chang… - IEEE Electron …, 2014 - ieeexplore.ieee.org
In this letter, one single-layer diamond-like carbon (DLC) resistive random access memory
(RRAM) and two opposite stacking double-layer DLC/HfO 2 RRAMs were prepared to …

Hydrogen induced redox mechanism in amorphous carbon resistive random access memory

YJ Chen, HL Chen, TF Young, TC Chang… - Nanoscale research …, 2014 - Springer
We investigated the bipolar resistive switching characteristics of the resistive random access
memory (RRAM) device with amorphous carbon layer. Applying a forming voltage, the …