S Tuli, NK Jha - arXiv preprint arXiv:2308.08666, 2023 - arxiv.org
Researchers constantly strive to explore larger and more complex search spaces in various scientific studies and physical experiments. However, such investigations often involve …
A Gupta, C Gupta, A Veloso… - IEEE Transactions on …, 2021 - ieeexplore.ieee.org
The influence of hot-carrier degradation (HCD) on lateral trap distribution within the device channel is experimentally investigated for gate-all-around nanowire (NW) nFETs. In …
K Sagar, M Satish - 2022 IEEE International Symposium on …, 2022 - ieeexplore.ieee.org
In this study, a detailed analysis of an enclosed layout circular double gate transistor (CDGT) at a gate length of 12 nm for High-Performance (HP) applications is presented. Further, we …
Over the past decade, artificial intelligence (AI) has gained significant interest in industry and academia. Deep neural network (DNN) models have exploded in size over the years. Wider …
Due to the outstanding electrostatic integrity of nanowire (NW) gate all-around (GAA) field- effect transistors (FETs), these devices have emerged as the most promising transistor …
Nowadays, computer chips are used in all kinds of industries and applications, from communication, transport to health care, and are an important part of our daily lives. The …