Characterization, Analysis and Modeling of Long-Term RF Reliability and Degradation of SiGe HBTs for High Power Density Applications
C Weimer, GG Fischer… - IEEE Transactions on …, 2023 - ieeexplore.ieee.org
This paper aims at determining RF operating limits of SiGe HBTs. Long-term stress tests
consisting of RF large-signal stress and periodic measurements of small-signal parameters …
consisting of RF large-signal stress and periodic measurements of small-signal parameters …