Q Zhou, C Zhang, J Tan, L Zhu… - 2017 IEEE 3rd …, 2017 - ieeexplore.ieee.org
A single-event-transient-hardened-by-design (SET-HBD) charge pump (CP) is proposed to
improve the reliability of the phase-locked loop (PLL) in SMIC 0.18 μm CMOS process. And …