Impact of graphene and single-layer BN insertion on bipolar resistive switching characteristics in tungsten oxide resistive memory

J Kim, D Kim, Y Jo, J Han, H Woo, H Kim, KK Kim… - Thin Solid Films, 2015 - Elsevier
The role of the atomic interface in the resistive switching in Al–WO 3–Al devices is
investigated by inserting metallic graphene or insulating hexagonal BN sheet between the …

Correlative analysis of conducting filament distribution at interfaces and bias-dependent noise sources in TiN/TiOx/Pt and Pt/TiOx/TiOy/Pt bipolar resistive switching …

JH Kim, YC Bae, AR Lee, KH Baek, JP Hong - Applied Physics Letters, 2015 - pubs.aip.org
We evaluated conducting filament distributions occurring at interfaces of TiN/TiO x/Pt and
Pt/TiO x/TiO y/Pt bipolar resistive switching elements after electroforming by identifying bias …

Parasitic resistive switching uncovered from complementary resistive switching in single active-layer oxide memory device

L Zhu, W Hu, C Gao, Y Guo - Semiconductor Science and …, 2017 - iopscience.iop.org
This paper reports the reversible transition processes between the bipolar and
complementary resistive switching (CRS) characteristics on the binary metal-oxide resistive …

A Study of the Electrical Characteristics of WOx Material for Non-Volatile Resistive Random Access Memory

KH Jung, KM Kim, SG Song, YS Park… - Journal of the Korean …, 2016 - koreascience.kr
In this study, we observed current-voltage characteristics of the MIM (metal-insulator-metal)
structure. The $ WO_x $ material was used between metal electrodes as the oxide insulator …

[PDF][PDF] 비-휘발성저항변화메모리응용을위한WOx 물질의전기적특성연구

정균호, 김경민, 송승곤, 박윤선… - 전기전자재료학회 …, 2016 - scholar.archive.org
In this study, we observed current-voltage characteristics of the MIM (metal-insulator-metal)
structure. The WOx material was used between metal electrodes as the oxide insulator. The …