Exponential growth in the number of transistors for each chip along with increasing clock frequencies and operational voltages and decreasing load capacitance are aggravating the …
M Dewan, MS Sadi - 2019 IEEE International Conference on …, 2019 - ieeexplore.ieee.org
Soft error is a form of error that has an incorrect signal or datum. It is one of the biggest reliability challenges in the usage of electronic devices and several safety critical …
A new error detection and correction methodology, defined as Horizontal-Vertical-Diagonal- N-Queen-Parity (HVDNQ), is proposed in this paper. This approach relies on five different …
SMTU Raju, MS Rahman - 2020 IEEE Region 10 Symposium …, 2020 - ieeexplore.ieee.org
Erroneous data can cause a system to be failed. Though there are several methods for detection and correction, with the increasing amount of errors, it becomes difficult, for both …