Gallium nitride vertical power devices on foreign substrates: a review and outlook

Y Zhang, A Dadgar, T Palacios - Journal of Physics D: Applied …, 2018 - iopscience.iop.org
Vertical gallium nitride (GaN) power devices have attracted increased attention due to their
superior high-voltage and high-current capacity as well as easier thermal management than …

[HTML][HTML] Status and prospects of plasma-assisted atomic layer deposition

H Knoops, T Faraz, K Arts, WMM Kessels - Journal of Vacuum Science …, 2019 - pubs.aip.org
Processing at the atomic scale is becoming increasingly critical for state-of-the-art electronic
devices for computing and data storage, but also for emerging technologies such as related …

Plasma-assisted atomic layer deposition of nickel oxide as hole transport layer for hybrid perovskite solar cells

D Koushik, M Jošt, A Dučinskas, C Burgess… - Journal of Materials …, 2019 - pubs.rsc.org
Low-temperature atomic layer deposition (ALD) offers significant merits in terms of
processing uniform, conformal and pinhole-free thin films, with sub-nanometer thickness …

Atomic layer deposition beyond thin film deposition technology

S Yasmeen, SW Ryu, SH Lee… - Advanced Materials …, 2023 - Wiley Online Library
Atomic layer deposition (ALD) is well known as the most advanced coating technique so far
due to its unique deposition characteristics, such as uniformity and 3D conformality. ALD is …

Foundations of atomic-level plasma processing in nanoelectronics

K Arts, S Hamaguchi, T Ito, K Karahashi… - Plasma Sources …, 2022 - iopscience.iop.org
This article discusses key elementary surface-reaction processes in state-of-the-art plasma
etching and deposition relevant to nanoelectronic device fabrication and presents a concise …

Shaping of metal–organic frameworks at the interface

J Wang, H Zhu, S Zhu - Chemical Engineering Journal, 2023 - Elsevier
Metal-organic frameworks (MOFs) have attracted great attention and become one of the
most intensively studied topics due to their high surface area, large porosity, tunable pore …

Crystal phase control during epitaxial hybridization of III‐V semiconductors with silicon

M Rio Calvo, JB Rodriguez, C Cornet… - Advanced Electronic …, 2022 - Wiley Online Library
The formation and propagation of anti‐phase boundaries (APBs) in the epitaxial growth of III‐
V semiconductors on Silicon is still the subject of great debate, despite the impressive …

Reliability study on the fatigue life of film cooling blades in advanced aero-engine turbines: Neglected crystal orientation uncertainty in casting

YC Zhao, HS Gao, H Cheng, YH Zhong, ZX Wen… - Aerospace Science and …, 2022 - Elsevier
The orientation uncertainty of single-crystal turbine blades is a neglected practical
engineering problem, and previous research has paid little attention to it. The work …

Structural, Optical and Electrical Properties of HfO2 Thin Films Deposited at Low-Temperature Using Plasma-Enhanced Atomic Layer Deposition

KM Kim, JS Jang, SG Yoon, JY Yun, NK Chung - Materials, 2020 - mdpi.com
HfO2 was deposited at 80–250° C by plasma-enhanced atomic layer deposition (PEALD),
and properties were compared with those obtained by using thermal atomic layer deposition …

[HTML][HTML] Defect engineering for high quality InP epitaxially grown on on-axis (001) Si

B Shi, J Klamkin - Journal of Applied Physics, 2020 - pubs.aip.org
Heteroepitaxy of indium phosphide (InP) and its lattice-matched alloys on silicon (Si) show
great promise for Si-based optoelectronic devices and photonic integrated circuits. Here, we …