Thermomechanical issues of high power laser diode catastrophic optical damage

J Souto, JL Pura, J Jiménez - Journal of Physics D: Applied …, 2019 - iopscience.iop.org
Catastrophic optical damage (COD) of high power laser diodes is a crucial factor limiting
ultra high power lasers. The understanding of the COD process is essential to improve the …

Catastrophic Optical Damage in Semiconductor Lasers: Physics and New Results on InGaN High‐Power Diode Lasers

M Hempel, S Dadgostar, J Jiménez… - physica status solidi …, 2022 - Wiley Online Library
Among the limitations known from semiconductor lasers, catastrophic optical damage (COD)
is perhaps the most spectacular power‐limiting mechanism. Here, absorption and …

Catastrophic optical damage in 808 nm broad area laser diodes: a study of the dark line defect propagation

S Dadgostar, JL Pura, I Mediavilla, J Souto… - Optics …, 2022 - opg.optica.org
We present a study of the propagation of dark line defects (DLDs) in catastrophically
damaged 808 nm laser diodes, based on cathodoluminescence (CL) measurements and …

Automated catastrophic optical damage inspection of semiconductor laser chip based on multi-scale strip convolution aggregation

S Guo, D Li, J Zhao, H Jia, B Luo, B Tang… - International Journal of …, 2024 - Springer
Catastrophic optical damage (COD) is one of the reasons limiting the output power and
lifetime of semiconductor lasers. Nevertheless, the automatic defects inspection of the COD …

Thermal and mechanical issues of high-power laser diode degradation

J Souto, JL Pura, J Jiménez - MRS Communications, 2018 - cambridge.org
A computational model for the evaluation of the thermomechanical effects that give rise to
the catastrophic optical damage of laser diodes has been devised. The model traces the …

CL as a tool for device characterisation: the case of laser diode degradation

S Dadgostar, J Souto, J Jiménez - Nano Express, 2021 - iopscience.iop.org
Cathodoluminescence is a powerful technique for the characterization of semiconductors.
Due to its high spatial resolution, it is emerging as a suitable method for the study of …

Effect of thermal lensing and the micrometric degraded regions on the catastrophic optical damage process of high-power laser diodes

JL Pura, J Souto, J Jiménez - Optics Letters, 2020 - opg.optica.org
Catastrophic optical damage (COD) is one of the processes limiting the lifetime of high-
power laser diodes. The understanding of this degradation phenomenon is critical to …

Analysis of in-plane thermal phonon transport in III–V compound semiconductor superlattices

K Kothari, M Maldovan - Nanoscale and Microscale …, 2018 - Taylor & Francis
Controlling thermal transport in optoelectronic devices is a fundamental determinant of
optimum performance. We study in-plane thermal transport mechanisms in GaAs/AlAs and …

Thermomechanical degradation of single and multiple quantum well AlGaAs/GaAs laser diodes

J Souto, JL Pura, A Torres, J Jiménez - Microelectronics Reliability, 2017 - Elsevier
The catastrophic degradation of laser diodes with active zones comprising either single
(SQW) or multiple quantum wells (MQW) has been analysed via finite element methods. This …

Microscopic degradation and failure processes in high-power diode lasers

J Souto, JL Pura, J Jiménez - 2019 IEEE High Power Diode …, 2019 - ieeexplore.ieee.org
In this work we analyse the microscopic issues of the catastrophic optical damage (COD) of
high power laser diodes. The COD is studied in terms of local heating of the active zone of …