Solution to 0/1 knapsack problem based on improved ant colony algorithm

H Shi - 2006 IEEE International Conference on Information …, 2006 - ieeexplore.ieee.org
Ant colony algorithms analogize the social behaviour of ant colonies, they are a class of
meta-heuristics which are inspired from the behavior of real ants. It was applied successfully …

Testing ICs: Getting to the core of the problem

BT Murray, JP Hayes - Computer, 1996 - ieeexplore.ieee.org
The article examines the market and technology trends affecting the testing of integrated
circuits, with emphasis on the role of predesigned components-cores-and built in self test …

Implicit test generation for behavioral VHDL models

F Ferrandi, F Fummi, D Sciuto - Proceedings International Test …, 1998 - ieeexplore.ieee.org
This paper proposes a behavioral-level test pattern generation algorithm for behavioral
VHDL descriptions. The proposed approach is based on the comparison between the …

Automatic test pattern generation for functional register-transfer level circuits using assignment decision diagrams

I Ghosh, M Fujita - … Transactions on Computer-Aided Design of …, 2001 - ieeexplore.ieee.org
In this paper, we present an algorithm for generating test patterns automatically from
functional register-transfer level (RTL) circuits that target detection of stuck-at faults in the …

Automatic generation of instruction sequences targeting hard-to-detect structural faults in a processor

S Gurumurthy, S Vasudevan… - 2006 IEEE International …, 2006 - ieeexplore.ieee.org
Testing a processor in native mode by executing instructions from cache has been shown to
be very effective in discovering defective chips. In previous work, we showed an efficient …

Design for hierarchical testability of RTL circuits obtained by behavioral synthesis

I Ghosh, A Raghunathan, NK Jha - IEEE transactions on …, 1997 - ieeexplore.ieee.org
In recent years, there has been growing interest in behavioral (high-level) synthesis for
testability. This is due to the fact that testability features, such as scan or the built-in self-test …

Automated mapping of pre-computed module-level test sequences to processor instructions

S Guramurthy, S Vasudevan… - … Conference on Test …, 2005 - ieeexplore.ieee.org
Executing instructions from the cache has been shown to improve the defect coverage of
real chips. However, although the faults detected by such tests can be determined, there has …

Fundamentals of testability-a tutorial

RR Fritzemeier, HT Nagle… - IEEE Transactions on …, 1989 - ieeexplore.ieee.org
A review is presented of electrical testing, failure mechanisms, fault models, fault simulation,
testability analysis, and test-generation methods for CMOS VLSI circuits. The relationships …

A design-for-testability technique for register-transfer level circuits using control/data flow extraction

I Ghosh, A Raghunathan, NK Jha - IEEE Transactions on …, 1998 - ieeexplore.ieee.org
In this paper, we present a technique for extracting functional (control/data flow) information
from register-transfer level controller/data path circuits, and illustrate its use in design for …

Architectural level test generation for microprocessors

J Lee, JH Patel - IEEE transactions on computer-aided design …, 1994 - ieeexplore.ieee.org
Hierarchically designed microprocessor-like VLSI circuits have complex data paths and
embedded control machines to execute instructions. When a test pattern has to be applied to …