Understanding latency variation in modern DRAM chips: Experimental characterization, analysis, and optimization

KK Chang, A Kashyap, H Hassan, S Ghose… - Proceedings of the …, 2016 - dl.acm.org
Long DRAM latency is a critical performance bottleneck in current systems. DRAM access
latency is defined by three fundamental operations that take place within the DRAM cell …

A survey of techniques for improving error-resilience of DRAM

S Mittal, MS Inukonda - Journal of Systems Architecture, 2018 - Elsevier
Aggressive process scaling and increasing demands of performance/cost efficiency have
exacerbated the incidences and impact of errors in DRAM systems. Due to this …

Characterizing and mitigating soft errors in gpu dram

MB Sullivan, N Saxena, M O'Connor, D Lee… - MICRO-54: 54th Annual …, 2021 - dl.acm.org
GPUs are used in high-reliability systems, including high-performance computers and
autonomous vehicles. Because GPUs employ a high-bandwidth, wide-interface to DRAM …

Duo: Exposing on-chip redundancy to rank-level ecc for high reliability

SL Gong, J Kim, S Lym, M Sullivan… - … Symposium on High …, 2018 - ieeexplore.ieee.org
DRAM row and column sparing cannot efficiently tolerate the increasing inherent fault rate
caused by continued process scaling. In-DRAM ECC (IECC), an appealing alternative to …

Low-cost soft error resilience with unified data verification and fine-grained recovery for acoustic sensor based detection

Q Liu, C Jung, D Lee, D Tiwarit - 2016 49th Annual IEEE/ACM …, 2016 - ieeexplore.ieee.org
This paper presents Turnstile, a hardware/software cooperative technique for low-cost soft
error resilience. Leveraging the recent advance of acoustic sensor based soft error …

Revisiting Residue Codes for Modern Memories

E Manzhosov, A Hastings, M Pancholi… - 2022 55th IEEE/ACM …, 2022 - ieeexplore.ieee.org
Residue codes have been traditionally used for compute error correction rather than storage
error correction. In this paper, we use these codes for storage error correction with surprising …

Enabling Effective Error Mitigation in Memory Chips That Use On-Die Error-Correcting Codes

M Patel - arXiv preprint arXiv:2204.10387, 2022 - arxiv.org
Improvements in main memory storage density are primarily driven by process technology
scaling, which negatively impacts reliability by exacerbating various circuit-level error …

Exploring and optimizing chipkill-correct for persistent memory based on high-density nvrams

D Zhang, V Sridharan, X Jian - 2018 51st Annual IEEE/ACM …, 2018 - ieeexplore.ieee.org
Emerging high-density non-volatile random access memories (NVRAMs) can significantly
enhance server main memory by providing both higher memory density and fast persistent …

Classification of benign and malignant pulmonary nodules based on deep learning

Y Zhang, J Zhang, L Zhao, X Wei… - 2018 5th international …, 2018 - ieeexplore.ieee.org
Lung cancer is one of the most common malignant tumors leading to death. Early diagnosis
of pulmonary nodules is of great significance for reducing the mortality of the lung cancer …

Stealth ECC: A data-width aware adaptive ECC scheme for DRAM error resilience

YS Lee, G Koo, YH Gong… - 2022 Design, Automation …, 2022 - ieeexplore.ieee.org
As DRAM process technology scales down and DRAM density continues to grow, DRAM
errors have become a primary concern in modern data centers. Typically, data centers have …