Surface based mass spectrometric approaches fill an important niche in the mass analysis
portfolio of tools. The particular niche depends on both the underlying physics and chemistry …

This article reviews the new physics and new applications of secondary ion mass
spectrometry using cluster ion probes. These probes, particularly C60, exhibit enhanced …

A protocol for three-dimensional molecular thin-film analysis is described that utilizes
imaging time-of-flight secondary ion mass spectrometry and large-area atomic force …

The present theoretical study explores the interaction of various energetic molecular
projectiles and clusters with a model polymeric surface, with direct implications for surface …

The advantages and drawbacks of using either monatomic or buckminsterfullerene primary
ions for metal-assisted secondary ion mass spectrometry (MetA-SIMS) are investigated …

Molecular dynamics simulations have been performed to model 5-keV C60 and Au3
projectile bombardment of an amorphous water substrate. The goal is to obtain detailed …

Buckminsterfullerene projectiles have demonstrated their outstanding capabilities for the
secondary ion mass spectrometric (SIMS) analysis of bulk organic films. In this contribution …

This article reports the latest developments of our theoretical studies of gas cluster
bombardment of model macromolecular samples using molecular dynamics simulations …

The early stages of C60 bombardment of octane and octatetraene crystals are modeled
using molecular dynamics simulations with incident energies of 5− 20 keV. Using the …

The role of the location of energy deposition during cluster ion bombardment on the quality
of molecular depth profiling was examined by varying the incident angle geometry …