ToF-SIMS 3D analysis of thin films deposited in high aspect ratio structures via atomic layer deposition and chemical vapor deposition

AM Kia, N Haufe, S Esmaeili, C Mart, M Utriainen… - Nanomaterials, 2019 - mdpi.com
For the analysis of thin films, with high aspect ratio (HAR) structures, time-of-flight secondary
ion mass spectrometry (ToF-SIMS) overcomes several challenges in comparison to other …

Implication of LXRs in the myelination of the peripheral nervous system

T El Jalkh - 2021 - theses.hal.science
The Liver X Receptors (LXRs) are members of the nuclear receptor superfamily, initially
considered as orphan receptors. The discovery of LXR ligands, the endogenous oxysterols …