Silicon nitride photonics is on the rise owing to the broadband nature of the material,
allowing applications of biophotonics, tele/datacom, optical signal processing and sensing …

Because of the demand for advanced measurement systems in the field of modern photonic
integrated circuits, optical frequency domain reflectometry (OFDR) is a robust technique for …

We describe a first distributed polarization analysis (DPA) system using binary polarization
rotators in an optical frequency domain reflectormeter (OFDR) capable of measuring the …

Adaptable and complex optical characterization of photonic integrated devices, permitting to
unearth possible design and fabrication errors in the different workflow steps are highly …

Many linear and nonlinear optics applications rely on micro-resonators (MRRs) with
carefully designed dispersion and coupling rate coefficients. These parameters are however …

In this paper, we propose a technique to characterize integrated power splitters and
waveguide losses. Taking advantage of the time domain resolution of an optical frequency …

We report our progress on an integrated interferometric testing engine for integrated
components, based on optical frequency domain reflectometry technique. Successful …

[EN] This PhD thesis covers the characterization of complex photonic integrated circuits
(PIC) by using Optical Frequency Domain Interferometry (OFDI). OFDI has a fairly simple …