Dependence of electrical characteristics on epitaxial layer structure of AlGaN/GaN HEMTs fabricated on freestanding GaN substrates

Y Ando, R Makisako, H Takahashi… - … on Electron Devices, 2021 - ieeexplore.ieee.org
This article reports a systematic study on the effects of the epitaxial layer structure on the
electrical characteristics of AlGaN/GaN high electron mobility transistors (HEMTs) fabricated …

Ultrafast broadband carrier and exciton dynamics of Fe-related centers in GaN

J Wang, F Shi, X Wu, J Yang, Y Chen, Q Wu… - Applied Physics …, 2023 - pubs.aip.org
The effect of Fe defects on carrier recombination and two-photon induced ultrafast exciton
dynamics in GaN crystals were investigated using femtosecond transient absorption …

A correlation between the defect states and yellow luminescence in AlGaN/GaN heterostructures

D Jana, TK Sharma - Journal of Applied Physics, 2017 - pubs.aip.org
AlGaN/GaN heterostructures are investigated by performing complementary spectroscopic
measurements under novel experimental configurations. Distinct features related to the …

[HTML][HTML] Suppression of the regrowth interface leakage current in AlGaN/GaN HEMTs by unactivated Mg doped GaN layer

T Liu, H Watanabe, S Nitta, J Wang, G Yu… - Applied Physics …, 2021 - pubs.aip.org
The leakage current caused by the Si pileup at the regrowth interface of AlGaN/GaN high
electron mobility transistors (HEMTs) is significantly suppressed by the semi-insulating Mg …

Effects of vacancy defects on the electronic structure and optical properties of GaN: Fe

W Jia, Y Niu, M Zhou, R Liu, L Zhang, X Wang… - Superlattices and …, 2019 - Elsevier
Using first-principles calculations based on the density functional theory, we investigated the
photoelectric properties of GaN and 6.25% Fe doped GaN both containing nitrogen vacancy …

[HTML][HTML] High-resistivity unintentionally carbon-doped GaN layers with nitrogen as nucleation layer carrier gas grown by metal-organic chemical vapor deposition

F Chen, S Sun, X Deng, K Fu, G Yu, L Song, R Hao… - AIP Advances, 2017 - pubs.aip.org
In this letter, high-resistivity unintentionally carbon-doped GaN layers with sheet resistivity
greater than 10 6 Ω/□ have been grown on c-plane sapphire substrates by metal-organic …

Confirmation of the compensation of unintentional donors in AlGaN/GaN HEMT structures by Mg-doping during initial growth of GaN buffer layer

D Jana, A Chatterjee, TK Sharma - Journal of Luminescence, 2020 - Elsevier
Abstract Effect of partial Mg doping on the compensation of unintentional donors at
epilayer/template interface and in the GaN channel layer of AlGaN/GaN High Electron …

空位缺陷和原子掺杂对氮化镓热导率影响的分子动力学模拟.

高志乐, 王继芬 - Electronic Components & Materials, 2023 - search.ebscohost.com
针对氮化镓(GaN) 基电子器件散热的背景, 基于非平衡分子动力学(NEMD)
方法研究了空位缺陷和原子掺杂对GaN 晶格热导率的影响. 结果表明, 空位缺陷和原子掺杂会 …

[PDF][PDF] Fe 掺杂GaN 光电特性的第一性原理研究

贾婉丽, 周淼, 王馨梅, 纪卫莉 - 物理学报, 2018 - wulixb.iphy.ac.cn
基于密度泛函理论体系, 计算了本征GaN 材料和12.5% 的Fe 掺杂GaN 体系的光电特性,
分析了晶体结构, 能带结构和电子态分布, 介电函数, 吸收系数, 折射率, 反射率 …

Effect of nitridation on the regrowth interface of AlGaN/GaN structures grown by molecular beam epitaxy on GaN templates

YY Wong, WC Huang, HD Trinh, TH Yang… - Journal of electronic …, 2012 - Springer
AlGaN/GaN structures were regrown on GaN templates using plasma-assisted molecular
beam epitaxy (PA-MBE). Prior to the regrowth, nitridation was performed using nitrogen …