Fractal analysis on surface topography of thin films: A review

W Zhou, Y Cao, H Zhao, Z Li, P Feng, F Feng - Fractal and fractional, 2022 - mdpi.com
The topographies of various surfaces have been studied in many fields due to the significant
influence that surfaces have on the practical performance of a given sample. A …

Minkowski functional characterization and fractal analysis of surfaces of titanium nitride films

AG Korpi, Ş Ţălu, M Bramowicz, A Arman… - Materials Research …, 2019 - iopscience.iop.org
The aim of this study is to gain a deeper understanding of the micromorphology
characteristics of thin titanium nitride (TiN) films sputtered on glass substrates by using ion …

Seeing is believing: atomic force microscopy imaging for nanomaterial research

J Zhong, J Yan - Rsc Advances, 2016 - pubs.rsc.org
The research and development of nanotechnology has led to materials science and
engineering entering the “nanomaterial era”. It is pivotal for analyzing the physicochemical …

Micromorphology characterization of copper thin films by AFM and fractal analysis

A Arman, Ş Ţălu, C Luna, A Ahmadpourian… - Journal of Materials …, 2015 - Springer
In this study, Cu thin films with layer thicknesses of 5, 25, and 50 nm were prepared by DC
magnetron-sputtering method and their three dimensional (3-D) surface topography were …

Quantifying nanoparticle layer topography: Theoretical modeling and atomic force microscopy investigations

Z Adamczyk, M Sadowska, M Nattich-Rak - Langmuir, 2023 - ACS Publications
A comprehensive method consisting of theoretical modeling and experimental atomic force
microscopy (AFM) measurements was developed for the quantitative analysis of …

Influence of scanning rate on quality of AFM image: Study of surface statistical metrics

D Sobola, Ş Ţălu, S Solaymani… - Microscopy Research …, 2017 - Wiley Online Library
The purpose of this work is to study the dependence of AFM‐data reliability on scanning
rate. The three‐dimensional (3D) surface topography of the samples with different micro …

Multifractal and optical bandgap characterization of Ta2O5 thin films deposited by electron gun method

R Shakoury, S Rezaee, F Mwema, C Luna… - Optical and Quantum …, 2020 - Springer
The micromorphology of tantalum pentoxide (Ta 2 O 5) thin films, deposited on glass
substrates by electron gun method, has been analyzed using atomic force microscopy …

Fractal features of carbon–nickel composite thin films

Ş Ţălu, M Bramowicz, S Kulesza… - Microscopy …, 2016 - Wiley Online Library
This work analyses the three‐dimensional (3‐D) surface texture of carbon–nickel (C–Ni)
films grown by radio frequency (RF) magnetron co‐sputtering on glass substrates. The C–Ni …

Microstructure and tribological properties of FeNPs@ aC: H films by micromorphology analysis and fractal geometry

S Ţălu, M Bramowicz, S Kulesza… - Industrial & …, 2015 - ACS Publications
This paper analyzes the three-dimensional (3D) surface texture of amorphous hydrogenated
carbon films with sputtered iron nanoparticles (FeNPs@ aC: H) deposited by a radio …

Performance analysis of GaAs based solar cells under gamma irradiation

N Papež, A Gajdoš, R Dallaev, D Sobola… - Applied Surface …, 2020 - Elsevier
The influence of gamma irradiation on gallium arsenide based photovoltaic cells was
investigated. This type of solar cell is used for advanced space application where radiation …