Synchrotron-based X-ray nanobeams are investigated as a tool to perturb microcontroller
circuits. An intense hard X-ray focused beam of a few tens of nanometers is used to target …

Hardware characterizations of integrated circuits have been evolving rapidly with the advent
of more precise, sophisticated and cost-efficient tools. In this paper we describe how the fine …

Laser Fault Injection Attacks (LFIA) are a major concern in physical security of electronic
circuits as they allow an attacker to inject a fault with a very high spatial accuracy. They are …

Laser fault injections induce transient faults into ICs by locally generating transient currents
that temporarily flip the outputs of the illuminated gates. Laser fault injection can be …

The need to increase the level of digital security standards requires a sustained research
effort on new means of perturbations likely to disturb the processing of integrated circuits. X …

This paper presents the design of a CMOS 40 nm D Flip-Flop cell and reports the laser fault
sensitivity mapping both with experiments and simulation results. Theses studies are driven …

Laser fault injection attacks induce transient faults into ICs by locally generating transient
currents capable of temporarily flipping the outputs of logic gates. Laser fault injection may …

Designing secure integrated systems requires methods and tools dedicated to simulating
that early design stages' the effects of laser-induced transient faults maliciously injected by …

We investigate the design of iterative, limited-precision mechanisms for single-good
auctions with dominant strategy equilibria. Our aim is to design mechanisms that minimize …

Visible light probing (VLP) introduced significant spatial resolution improvement by
decreasing the wavelength beyond 1064nm. VLP requires thinning the device backside …