[图书][B] Multi-run memory tests for pattern sensitive faults

I Mrozek - 2019 - Springer
Semiconductor memory is a crucial part of today's electronic systems. The percentage of
silicon areas devoted to memory components in embedded systems and systems-on-chip …

CAmetrics: A tool for advanced combinatorial analysis and measurement of test sets

M Leithner, K Kleine, DE Simos - 2018 IEEE international …, 2018 - ieeexplore.ieee.org
Combinatorial testing (CT) has established itself as an efficient and effective approach for
generating test sets, guaranteeing that all interactions of parameters up to a given strength t …

An empirical comparison of fixed-strength and mixed-strength for interaction coverage based prioritization

R Huang, Q Zhang, TY Chen, J Hamlyn-Harris… - IEEE …, 2018 - ieeexplore.ieee.org
Test case prioritization (TCP) plays an important role in identifying, characterizing,
diagnosing, and correcting faults quickly. The TCP has been widely used to order test cases …

[PDF][PDF] Combinatorial robustness testing based on error-constraints

K Fögen - 2021 - publications.rwth-aachen.de
Robustness is an important property of a software, which must be tested in addition to a
software's functionality. This requires invalid values and invalid value combinations to be …

Optimal controlled random tests

I Mrozek, V Yarmolik - … Systems and Industrial Management: 16th IFIP TC8 …, 2017 - Springer
Controlled random tests, methods of their generation, main criteria used for their synthesis,
such as the Hamming distance and the Euclidean distance, as well as their application to …

Controlled random testing

I Mrozek, I Mrozek - Multi-run Memory Tests for Pattern Sensitive Faults, 2019 - Springer
The chapter covers controlled random tests (CRTs) that are extensively used for diagnosing
complex digital circuits and systems. First, the basic definition and properties of CRTs are …

Towards Quality Improvement and Analysis of Combinatorial Testing

EH Choi, O Mizuno - 2017 - ipsj.ixsq.nii.ac.jp
Combinatorial testing is a widely-used testing technique to detect system failures caused by
parameter interactions. This paper introduces our ongoing work to develop a systematic …