This brief presents a review of developments in spin-transfer-torque magnetoresistive
random access memory (STT-MRAM) sensing over the past 20 years from a circuit design …

Uncertainties have become a major concern in integrated circuit design. In order to avoid the
huge number of repeated simulations in conventional Monte Carlo flows, this paper presents …

In recent years, a large number of works have surfaced demonstrating applications of
machine learning in the field of integrated circuit testing. Many of these works showcase the …

Fabrication process variations are a major source of yield degradation in the nanoscale
design of integrated circuits (ICs), microelectromechanical systems (MEMSs), and photonic …

A hydrological system is highly complex in nature with all processes within the system
constituting dynamic and nonlinear interaction of several variables. Databased soft …

Accurately estimating the rare failure rates for nanoscale circuit blocks (eg, static random-
access memory, D flip-flop, etc.) is a challenging task, especially when the variation space is …

Fast yield learning is critical to bringing products to the market in a timely fashion and is
strongly linked to product revenues. This paper reviews methods to enable efficient yield …

Integrated circuit (IC) testing presents complex problems that, when ICs become large, are
exceptionally difficult to solve by traditional computing techniques. To deal with …

Memory-based physical unclonable functions (PUFs) have been studied and developed as
powerful primitives to generate device-specific random keys, which can be used for various …

Motivated by the challenges in detecting extremely rare failures for sophisticated
specifications in circuit design, we consider the problem of detecting regions of interest …