[图书][B] Helium Ion Microscopy: Principles and Applications
DC Joy - 2013 - Springer
The scanning electron microscope (SEM) has become the most widely used
highperformance microscope. However because of the fundamental limitations of electron …
highperformance microscope. However because of the fundamental limitations of electron …
Secondary electron emission and yield spectra of metals from Monte Carlo simulations and experiments
M Azzolini, M Angelucci, R Cimino… - Journal of Physics …, 2018 - iopscience.iop.org
In this work, we present a computational method, based on the Monte Carlo statistical
approach, for calculating electron energy emission and yield spectra of metals, such as …
approach, for calculating electron energy emission and yield spectra of metals, such as …
Surface sensitivity of secondary electrons emitted from amorphous solids: calculation of mean escape depth by a Monte Carlo method
A Monte Carlo simulation method for study of electron-solid interaction based on modeling
of cascade secondary electron (SE) production and transportation has been used to …
of cascade secondary electron (SE) production and transportation has been used to …
[HTML][HTML] Combined first-principles-Monte Carlo analysis to evaluate the effect of surface hydrogen on the secondary electron yield of nickel
Secondary electron yield (SEY) modeling of Ni (110) surface has been carried out with and
without the inclusion of wavevector-dependent harmonic corrections (which alter both the …
without the inclusion of wavevector-dependent harmonic corrections (which alter both the …
MAST-SEY: MAterial Simulation Toolkit for Secondary Electron Yield. A monte carlo approach to secondary electron emission based on complex dielectric functions
MAST-SEY is an open-source Monte Carlo code capable of calculating secondary electron
emission using input data generated entirely from first principle (density functional theory) …
emission using input data generated entirely from first principle (density functional theory) …
Surface ionizing dose deposited by low energy electrons (10 eV–10 keV) in eleven monoatomic materials: Monte Carlo calculations and analytical expressions
Q Gibaru, C Inguimbert, P Caron, M Belhaj… - Applied Surface …, 2022 - Elsevier
An analytical formula for the ionizing dose of low energy electrons is proposed. The
expressions have been validated for 11 monatomic elements (C, Be, Al, Si, Ti, Ni, Cu, Ge …
expressions have been validated for 11 monatomic elements (C, Be, Al, Si, Ti, Ni, Cu, Ge …
[HTML][HTML] First principles inelastic mean free paths coupled with Monte Carlo simulation of secondary electron yield of Cu-Ni, Cu-Zn, and Mo-Li
RE Gutierrez, I Matanovic, MP Polak… - Journal of Applied …, 2021 - pubs.aip.org
Secondary electron yield (SEY) is relevant for widely used characterization methods (eg,
secondary electron spectroscopy and electron microscopy) and materials applications (eg …
secondary electron spectroscopy and electron microscopy) and materials applications (eg …
Effect of rough surface morphology on secondary electron emission from metal surface
N Zhang, M Cao, WZ Cui, TC Hu - Japanese Journal of Applied …, 2017 - iopscience.iop.org
Surface morphology is one of the main factor affecting the secondary electron (SE) emission
from a rough metal surface. To overcome the limitation of only using the roughness to reveal …
from a rough metal surface. To overcome the limitation of only using the roughness to reveal …
[HTML][HTML] Coupled analysis to probe the effect of angular assignments on the secondary electron yield (SEY) from copper electrodes
Secondary electron emission from copper is probed utilizing Monte Carlo simulations that
take account of elastic scattering based on the Mott theory and inelastic collisions based on …
take account of elastic scattering based on the Mott theory and inelastic collisions based on …
[HTML][HTML] Probing changes in secondary electron yield from copper electrodes due to surface defects and changes in crystal orientation
There is considerable interest in mitigating secondary electron emission (SEE) from surfaces
and electrodes produced by incident electrons, due to the deleterious effects of SEE in …
and electrodes produced by incident electrons, due to the deleterious effects of SEE in …