Towards critical flip-flop identification for soft-error tolerance with graph neural networks

L Lu, J Chen, M Ulbricht, M Krstic - IEEE Transactions on …, 2023 - ieeexplore.ieee.org
Nanometer circuits are becoming increasingly susceptible to soft errors. Selective hardening
is a less expensive technique to improve the reliability of circuits because it hardens the …

A methodology for identifying critical sequential circuits with graph convolutional networks

L Lu, J Chen, M Ulbricht, M Krstic - 2022 IEEE Computer …, 2022 - ieeexplore.ieee.org
The reliability of circuits becomes increasingly important with the transistor scaling. One
efficient approach to address this problem is to select the critical components and apply …

Composing graph theory and deep neural networks to evaluate seu type soft error effects

A Balakrishnan, T Lange, M Glorieux… - 2020 9th …, 2020 - ieeexplore.ieee.org
Rapidly shrinking technology node and voltage scaling increase the susceptibility of Soft
Errors in digital circuits. Soft Errors are radiation-induced effects while the radiation particles …

Machine Learning Methodologies to Predict the Results of Simulation-Based Fault Injection

L Lu, J Chen, M Ulbricht, M Krstic - IEEE Transactions on …, 2024 - ieeexplore.ieee.org
Simulation-based fault injection is a widely used technique for early-stage circuit reliability
analysis. However, it consumes significant time, particularly for complex circuits. This paper …

Gate-Level Graph Representation Learning: A Step Towards the Improved Stuck-at Faults Analysis

A Balakrishnan, D Alexandrescu… - … on Quality Electronic …, 2021 - ieeexplore.ieee.org
As the circuit implementation predominantly focuses on the higher density and performance
with the technology scaling, more adverse types of faults and effects have been investigated …

[PDF][PDF] A Synthetic, Hierarchical Approach for Modelling and Managing Complex Systems' Quality and Reliability

A Balakrishnan - scholar.archive.org
The doctoral thesis addresses today's high-performance designs requirements in terms of
validation and reliability. The project aims at developing a comprehensive approach that …

RESCUE: interdependent challenges of reliability, security and quality in nanoelectronic systems

M Jenihhin, S Hamdioui, MS Reorda… - … , Automation & Test …, 2020 - ieeexplore.ieee.org
The recent trends for nanoelectronic computing systems include machine-to-machine
communication in the era of Internet-of-Things (IoT) and autonomous systems, complex …

[引用][C] Single Event Effect Sensitivity on Artificial Intelligence SoC with Different Algorithm Models

H Zhangb, W Gaoa