A literature review on sampling techniques in semiconductor manufacturing

J Nduhura-Munga, G Rodriguez-Verjan… - IEEE Transactions …, 2013 - ieeexplore.ieee.org
This paper reviews sampling techniques for inspection in semiconductor manufacturing. We
discuss the strengths and weaknesses of techniques developed in the last last 20 years for …

[HTML][HTML] Sustainability diffusion in the Chinese semiconductor industry: A stakeholder salience perspective

S Tian, M Wang, L Wu, A Kumar, KH Tan - International Journal of …, 2025 - Elsevier
The semiconductor sector plays a crucial role in shaping national strategies and driving
economic growth; however, it faces significant challenges prompting a shift towards …

Hybrid dispatching and genetic algorithm for the surface mount technology scheduling problem in semiconductor factories

HK Wang, TY Yang, YH Wang, CL Wu - International Journal of Production …, 2025 - Elsevier
Surface mount technology (SMT) is widely used in semiconductor packaging factories to
assemble electronic components onto printed circuit boards. Therefore, reducing …

Systems Theory and Evidence‐Based Decision‐Making as Keys for Arbitrating between Optimal Production and Efficient Maintenance: A Case Study

A Hallioui, B Herrou, R Santos, P Katina… - Discrete Dynamics in …, 2022 - Wiley Online Library
Organizations in the 21st century operate in evolving and highly competitive environments—
such environments are catalysts for deviation in organization‐planned operations, including …

Towards a new knowledge-based framework for integrated quality control planning

F Oukhay, A Badreddine… - European Journal of …, 2021 - inderscienceonline.com
This paper presents a new knowledge-based framework for integrated quality control
planning. The proposed approach is based on the concepts of advanced product quality …

Optimized allocation of defect inspection capacity with a dynamic sampling strategy

GL Rodriguez-Verjan, S Dauzère-Pérès… - Computers & Operations …, 2015 - Elsevier
In semiconductor manufacturing, in-line inspections are necessary to monitor processes,
products and tools in order to reduce excursions and achieve high yields of final products …

Simulation model to control risk levels on process equipment through metrology in semiconductor manufacturing

A Sendón, S Dauzère-Pérès… - 2015 Winter Simulation …, 2015 - ieeexplore.ieee.org
This paper first presents a simulation model implemented to study a specific workcenter in
semiconductor manufacturing facilities (fabs) with the objective of controlling the risk on …

[PDF][PDF] Dynamic management of traffic congestion-case study in developing countries

JN Munga, R Kasongo - International journal of traffic and …, 2023 - researchgate.net
In a context of globalization where economic transactions are consumed at a very high pace,
being able to rapidly move from a place to another is key in our society. This is especially …

Smart sampling for risk reduction in semiconductor manufacturing

GLR Verjan - 2014 - theses.hal.science
In semiconductor manufacturing, several types of controls are required to ensure the quality
of final products. In this thesis, we focus on defectivity inspections, which aim at monitoring …

A mathematical model for estimating defect inspection capacity with a dynamic control strategy

GL Rodriguez-Verjan… - Proceedings of the …, 2012 - ieeexplore.ieee.org
In this paper, we introduce a mathematical model for estimating the use of defect inspection
capacity. Until recently, the selection of lots to be inspected was only done at the beginning …