Electrodes for semiconductor gas sensors

SP Lee - Sensors, 2017 - mdpi.com
The electrodes of semiconductor gas sensors are important in characterizing sensors based
on their sensitivity, selectivity, reversibility, response time, and long-term stability. The types …

High barrier height Au/n-type InP Schottky contacts with a POxNyHz interfacial layer

DT Quan, H Hbib - Solid-state electronics, 1993 - Elsevier
A new insulation film, PO x N y H z, has been fabricated on n-InP substrate surface using
vapor transport technique for use as an interfacial layer on n-InP Schottky contact devices …

Temperature dependence of the electrical characteristics of Yb/p‐InP tunnel metal‐insulator‐semiconductor junctions

A Singh, KC Reinhardt, WA Anderson - Journal of applied physics, 1990 - pubs.aip.org
High barrier Yb/p‐InP metal‐insulator‐semiconductor (MIS) and metal‐semiconductor (MS)
junctions were fabricated by evaporation of Yb on InP: Zn substrates. The capacitance …

Properties of Pt Schottky type contacts on high-resistivity CdZnTe detectors

AE Bolotnikov, SE Boggs, CMH Chen, WR Cook… - Nuclear Instruments and …, 2002 - Elsevier
In this paper, we present studies of the I–V characteristics of CdZnTe (CZT) detectors with Pt
contacts fabricated from high-resistivity single crystals grown by the high-pressure Bridgman …

Physics of Schottky barrier junctions

MS Tyagi - Metal-Semiconductor Schottky Barrier Junctions and …, 1984 - Springer
A rectifying metal-semiconductor contact is known as a Schottky barrier after W. Schottky,
who first proposed a model for barrier formation. Our knowledge of metal-semiconductor …

A new method to fabricate Au/n-type InP Schottky contacts with an interfacial layer

K Hattori, Y Torii - Solid-state electronics, 1991 - Elsevier
A method to fabricate Au-n-type InP Schottky contacts with an interfacial layer has been
developed. The interfacial layer is formed by deposition of a P x O y layer and reaction of this …

Current-voltage characteristics of Ag/TiO2/n-InP/Au Schottky barrier diodes

AK Bilgili, T Güzel, M Özer - Journal of Applied Physics, 2019 - pubs.aip.org
The effect of the TiO 2 interfacial layer on rectifying junction parameters of Ag/TiO 2/n-InP/Au
Schottky diodes has been investigated using current-voltage (IV) measurements in the …

Ar ion-beam etching characteristics and damage production in InP

O Wada - Journal of Physics D: Applied Physics, 1984 - iopscience.iop.org
Sputtering yield characteristics of Ar ion-beam etching on InP have been determined.
Damage generated by ion-beam bombardment has also been investigated by using …

Semiconductor analysis using organic‐on‐inorganic contact barriers. II. Application to InP‐based compound semiconductors

SR Forrest, ML Kaplan, PH Schmidt - Journal of applied physics, 1986 - pubs.aip.org
Organic‐on‐inorganic (OI) contact barrier devices have been applied to the study of InP and
In0. 53Ga0. 47As surfaces. The characteristics of these devices differ from OI diodes …

Electrical and interfacial properties of Au/n-InP Schottky contacts with nickel phthalocyanine (NiPc) interlayer

V Rajagopal Reddy - Indian Journal of Physics, 2015 - Springer
The electrical and interfacial properties of the Au/n-InP and Au/NiPc Schottky contact on n-
type InP have been analyzed by I–V, C–V, C–f and G–f measurements. The NiPc-based …