Temperature and current density prediction in solder joints using artificial neural network method
Purpose Due to the miniaturization of electronic devices, the increased current density
through solder joints leads to the occurrence of electromigration failure, thereby reducing the …
through solder joints leads to the occurrence of electromigration failure, thereby reducing the …
Physics-Informed Learning Based Multiphysics Simulation for Fast Transient TSV Electromigration Analysis
Through Silicon Vias (TSVs) are vulnerable to electromigration (EM) degradation due to
their high local current densities, thereby reducing the reliability of 3D ICs with stack dies …
their high local current densities, thereby reducing the reliability of 3D ICs with stack dies …
Linear time electromigration analysis based on physics-informed sparse regression
In this work, we propose a novel physics-informed sparse regression (PISR) framework to
solve stress evolution (described by Korhonen's equations) in general multisegment wires …
solve stress evolution (described by Korhonen's equations) in general multisegment wires …
PostPINN-EM: Fast Post-Voiding Electromigration Analysis Using Two-Stage Physics-Informed Neural Networks
In this paper, we propose a novel machine learning-based approach, called PostPInn-Em,
for solving the partial differential equations for stress evolution in a confined metal …
for solving the partial differential equations for stress evolution in a confined metal …
Multilayer perceptron-based stress evolution analysis under dc current stressing for multisegment wires
Electromigration (EM) is one of the major concerns in the reliability analysis of very large-
scale integration (VLSI) systems due to the continuous technology scaling. Accurately …
scale integration (VLSI) systems due to the continuous technology scaling. Accurately …
A Deep Learning Framework for Solving Stress-based Partial Differential Equations in Electromigration Analysis
The electromigration-induced reliability issues (EM) in very large scale integration (VLSI)
circuits have attracted continuous attention due to technology scaling. Traditional EM …
circuits have attracted continuous attention due to technology scaling. Traditional EM …
[图书][B] Machine Learning Approaches for VLSI Reliability Analysis
W Jin - 2023 - search.proquest.com
Abstract The reliability of Very Large Scale Integration (VLSI) circuits is crucial in modern
electronic devices. VLSI circuits, which contain millions of transistors, are vulnerable to a …
electronic devices. VLSI circuits, which contain millions of transistors, are vulnerable to a …
Hierpinn-em: Fast learning-based electromigration analysis for multi-segment interconnects using hierarchical physics-informed neural network
Electromigration (EM) becomes a major concern for VLSI circuits as the technology
advances in the nanometer regime. The crux of problem is to solve the partial differential …
advances in the nanometer regime. The crux of problem is to solve the partial differential …
Analytical Post-Voiding Modeling and Efficient Characterization of EM Failure Effects Under Time-Dependent Current Stressing
Electromigration (EM) has become the major concern for integrated circuits (ICs) in
advanced technology nodes. Traditional empirical EM models, such as Black's equation …
advanced technology nodes. Traditional empirical EM models, such as Black's equation …