Electromigration Test Chip Experiments from Realistic Power Grid Structures: Failure Trend Comparison and Statistical Analysis

YH Yi, C Kim, A Kteyan, A Volkov… - 2024 IEEE …, 2024 - ieeexplore.ieee.org
This work presents electromigration (EM) silicon data from realistic power grid device-under-
tests (DUT). Power grids featuring logic gate equivalent quasi-load cells were generated by …

Study on Non-Conformal Mesh Approach Applied on Layered Microelectronic Structure

L Dobre, A Bojita, M Purcar… - … on Modern Power …, 2023 - ieeexplore.ieee.org
Heater devices can have different shapes and sizes and can be made of different materials,
such as polysilicon and metals. These structures are used for their fast and effective …

Practical precision analog and mixed signal circuits and hardware security

PS Ebenezer - 2023 - search.proquest.com
The semiconductor industry supports a wide range of sectors, including computer systems,
mobile devices, communication systems, medical equipment, military, and many more. As …